Powder XRD, Cu Kalpha radiation
Cu-TCNQ powder · Powder
D8 Advanced diffractometer, lambda 1.54178 A, 40 kV, 40 mA.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu-TCNQ crystallinity | high crystallinity and purity | — | — | Qualitative Qualitative | 1681 · 3.1 · Figure 3a |