Powder X-ray diffraction
ZIF-PIO-3 separator · Thin Film
ZIF-67, ZIF-PIO and simulated ZIF-67 compared; Cu Kalpha in SI characterisation.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| ZIF-67 XRD peak (002) | 10.42 deg 2theta | — | — | Text Exact Reported | 5 · Results and Discussion · Figure 2d |
| ZIF-67 XRD peak (011) | 7.36 deg 2theta | — | — | Text Exact Reported | 5 · Results and Discussion · Figure 2d |
| ZIF-67 XRD peak (112) | 12.78 deg 2theta | — | — | Text Exact Reported | 5 · Results and Discussion · Figure 2d |
| ZIF-67 XRD peak (222) | 18.1 deg 2theta | — | — | Text Exact Reported | 5 · Results and Discussion · Figure 2d |