Powder X-ray diffraction
purified Ni-ett powder · Powder
Powder XRD patterns for the three OMCPs; Figure S14 in the SI and main text report diffraction positions and d-spacings.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ni-btt lamellar stacking distance | intense peak at 6.0 degrees; d = 6.78 Angstrom | — | — | Text Exact Reported | 5 · 2.2 · Figure S14 referenced |
| Ni-diett lamellar stacking distance | 11.9 degrees broad peak; d = 3.42 Angstrom | — | — | Text Exact Reported | 5 · 2.2 · Figure S14 referenced |
| Ni-ett lamellar stacking distance | 11.9 degrees broad peak; d = 3.42 Angstrom | — | — | Text Exact Reported | 5 · 2.2 · Figure S14 referenced |