Field emission scanning electron microscopy, TESCAN MIRA3 XMU
ZIF-8/PS thin film · Thin Film
30 kV; top-view and cross-sectional FESEM for PS and ZIF-8/PS.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| PS pore size | ~900 nm | — | — | Text Approximate | 4 · Results and Discussion · Fig. 2 |
| PS pin-shaped pore thickness | ~15 um | — | — | Text Approximate | 4 · Results and Discussion · Fig. 2 |
| ZIF-8/PS grain size | ~12 nm | — | — | Text Approximate | 4 · Results and Discussion · Fig. 2 |
| ZIF-8 film thickness on PS | ~170 nm | — | — | Text Approximate | 4 · Results and Discussion · Fig. 2d |