Spectroscopy — Performance Improvement of Photodetectors Based on ZIF-8 Nanostructures on Porous Silicon Substrate

3 measurement groups · 11 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

ZIF-8/PS thin film · Thin Film

FTIR range 600-4000 cm-1 for PS and ZIF-8/PS.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
ZIF-8/PS CH3 FTIR peak	2925 cm-1	—	—	Text Rounded Reported	4 · Results and Discussion · Fig. 3
ZIF-8 aromatic C-H FTIR peak	3418 cm-1	—	—	Text Rounded Reported	4 · Results and Discussion · Fig. 3
ZIF-8/PS C=N FTIR peak	1505 cm-1	—	—	Text Rounded Reported	4 · Results and Discussion · Fig. 3
ZIF-8/PS imidazole-ring FTIR band range	650 to 1550 cm-1	—	—	Text Range	4 · Results and Discussion · Fig. 3
ZIF-8/PS N-H FTIR peak	1703 cm-1	—	—	Text Rounded Reported	4 · Results and Discussion · Fig. 3
PS Si-H FTIR peak	852 cm-1	—	—	Text Rounded Reported	4 · Results and Discussion · Fig. 3
Si-O-Si FTIR peak	1085 cm-1	—	—	Text Rounded Reported	4 · Results and Discussion · Fig. 3

ZIF-8/PS thin film · Thin Film

Excitation wavelength 290 nm at room temperature; ZIF-8/PS and ZIF-8/Si compared.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
PL FWHM for ZIF-8/PSMarked as a best value within this paper	75 nm	—	—	Text Rounded Reported	5 · Results and Discussion · Fig. 5
PL FWHM for ZIF-8/Si	95 nm	—	—	Text Rounded Reported	5 · Results and Discussion · Fig. 5
PL emission peak wavelength	425 nm	—	—	Text Rounded Reported	5 · Results and Discussion · Fig. 5

ZIF-8/PS thin film · Thin Film

Reflectance spectra of ZIF-8/PS and ZIF-8/Si under UV illumination.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Reflectance decrease for ZIF-8/PS versus ZIF-8/Si	~80% decrease	—	—	Text Approximate	5 · Results and Discussion · Fig. 4