Electrical Transport — Metal-organic framework nanosheets for enhanced performance of organic photovoltaic cells

4 measurement groups · 9 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

P3HT-Zn2(ZnTCPP)-PCBM SCLC device, 100 nm active layer · Thin Film

Same SCLC method; MON-containing 100 nm active layer; n=3 devices.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electron mobility	(2.14+/-0.46)x10-3	—	+/- 0.46x10-3	SI Table Exact Reported	26 · Table S3
hole mobility	(3.20+/-0.48)x10-3	—	+/- 0.48x10-3	SI Table Exact Reported	26 · Table S3

P3HT-Zn2(ZnTCPP)-PCBM SCLC device, 150 nm active layer · Thin Film

Same SCLC method; MON-containing 150 nm active layer; n=3 devices.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
reported hole-mobility increase	factor of 10	—	—	Text Rounded Reported	5
electron mobility	(2.13+/-0.14)x10-3	—	+/- 0.14x10-3	SI Table Exact Reported	26 · Table S3
hole mobility	(2.12+/-0.34)x10-3	—	+/- 0.34x10-3	SI Table Exact Reported	26 · Table S3

P3HT-PCBM SCLC device, 100 nm active layer · Thin Film

Hole-only ITO:PEDOT/PSS:active layer:MoO3:Ag and electron-only ITO:ZnO:active layer:BCP:Ag; field-dependent Mott-Gurney fit; n=3 devices.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electron mobility	(3.77+/-0.71)x10-3	—	+/- 0.71x10-3	SI Table Exact Reported	26 · Table S3
hole mobility	(6.06+/-0.50)x10-4	—	+/- 0.50x10-4	SI Table Exact Reported	26 · Table S3

P3HT-PCBM SCLC device, 150 nm active layer · Thin Film

Same SCLC method as 100 nm reference devices; n=3 devices.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
electron mobility	(1.35+/-0.07)x10-3	—	+/- 0.07x10-3	SI Table Exact Reported	26 · Table S3
hole mobility	(1.13+/-0.17)x10-4	—	+/- 0.17x10-4	SI Table Exact Reported	26 · Table S3