Diffraction Structure — Air/liquid interfacial formation process of conductive metal–organic framework nanosheets

Measurement evidence

Diffraction Structure

Air/liquid interfacial formation process of conductive metal–organic framework nanosheets · Ohata T., Nomoto A., Watanabe T. et al. · Journal of Colloid and Interface Science · 2023 · 769-784

1 measurement group · 4 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Out-of-plane XRD and grazing-incidence in-plane XRD

X-ray diffraction and scattering

HITP-Ni-NS_1 min · Nanosheet

HITP-Ni-NS deposited on Si substrates; synchrotron X-ray source lambda = 1.24 Angstrom, helium flow; additional SmartLab Cu K-alpha measurements.

Temperature: room temperature
Atmosphere: helium flow or air depending on instrument
Geometry: Si substrate
Context: HITP-Ni-NS_1 min, 60 min and 240 min
Measurement source: 12 (journal p. 780) · 3.1.7 Effect on crystal structure and orientation · Fig. 8

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Interlayer pi-pi stacking distance	d = 3.22(1) Angstrom	—	0.01 Angstrom	Caption Exact Reported	3 (journal p. 771) · Figure 1 caption · Fig. 1
In-plane metrically hexagonal lattice parameter a = b	a = b = 21.36(1) Angstrom; later text gives a = b ~21.4 Angstrom	—	0.01 Angstrom	Caption Exact Reported	2-3 (journal pp. 770-771) · Introduction and Fig. 1 caption · Fig. 1
XRD-derived interlayer distance	d ~3.2 Angstrom	—	—	Text Approximate	12 (journal p. 780) · 3.1.7 Effect on crystal structure and orientation · Fig. 8a-c
Out-of-plane XRD layer-stacking peak Q	Q ~1.9 A-1	—	—	Text Approximate	12 (journal p. 780) · 3.1.7 Effect on crystal structure and orientation · Fig. 8a-c