Microscopy Morphology

Wilhelmy plate surface-pressure/mean-molecular-area isotherms with in-situ Brewster angle microscopy

HITP-Ni-NS_1 min · Nanosheet

HITP-Ni-NS prepared with t = 1, 60, 120, 180 and 240 min; continuous surface compression at room temperature in air.

Temperature: 293-294
Atmosphere: air
Geometry: PTFE Langmuir trough; BAM scale bar 1 mm
Context: pristine HITP-Ni nanosheets at air/liquid interface
Measurement source: 6 (journal p. 774) · 3.1.2 In-situ investigation into surface pressure and morphology · Fig. 3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Mean molecular area at pi = 10 mN m-1 for HITP-Ni-NS_120 min	A_pi10 = 2.4 Angstrom2 molecule-1	—	—	Text Rounded Reported	5 (journal p. 773) · 3.1.2 In-situ investigation into surface pressure and morphology · Fig. 3b
Mean molecular area at pi = 10 mN m-1 for HITP-Ni-NS_180 min	A_pi10 = 2.5 Angstrom2 molecule-1	—	—	Text Rounded Reported	5 (journal p. 773) · 3.1.2 In-situ investigation into surface pressure and morphology · Fig. 3b
Mean molecular area at pi = 10 mN m-1 for HITP-Ni-NS_1 min	A_pi10 = 1.8 Angstrom2 molecule-1	—	—	Text Rounded Reported	5 (journal p. 773) · 3.1.2 In-situ investigation into surface pressure and morphology · Fig. 3b
Mean molecular area at pi = 10 mN m-1 for HITP-Ni-NS_240 minMarked as a best value within this paper	A_pi10 = 2.6 Angstrom2 molecule-1	—	—	Text Rounded Reported	5 (journal p. 773) · 3.1.2 In-situ investigation into surface pressure and morphology · Fig. 3b
Mean molecular area at pi = 10 mN m-1 for HITP-Ni-NS_60 min	A_pi10 = 2.2 Angstrom2 molecule-1	—	—	Text Rounded Reported	5 (journal p. 773) · 3.1.2 In-situ investigation into surface pressure and morphology · Fig. 3b
Second inflection surface-pressure range where overlap begins	pi = 22-35 mN m-1	—	—	Text Range	5 (journal p. 773) · 3.1.2 In-situ investigation into surface pressure and morphology · Fig. 3a; Fig. S8

SEM and AFM

Scanning electron microscopy Atomic force microscopy

HITP-Ni-NS_1 min · Nanosheet

HITP-Ni-NS on Si substrates after a single deposition cycle at pi = 5 mN m-1; AFM images obtained after air exposure to reduce noisy radical-related imaging.

Temperature: room temperature
Atmosphere: air for AFM; SEM in vacuo
Geometry: Si substrate
Context: standing-time series of pristine HITP-Ni-NS with possible HITP-Ni_subphase attachment at longer times
Measurement source: 7 (journal p. 775) · 3.1.4 Ex-situ investigation into microscopic surface morphology, thickness and lateral size · Fig. 5

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Lateral domain size distribution centre for HITP-Ni-NS_1 min	~45 nm	—	—	Text Approximate	7 (journal p. 775) · 3.1.4 Ex-situ investigation into microscopic surface morphology, thickness and lateral size · Fig. S26
Lateral domain size distribution centre for later HITP-Ni-NS samplesMarked as a best value within this paper	~70 nm for all other HITP-Ni-NS with increased t	—	—	Text Approximate	7 (journal p. 775) · 3.1.4 Ex-situ investigation into microscopic surface morphology, thickness and lateral size · Fig. S26
Surface roughness Ra for HITP-Ni-NS_1 min	0.7(1) nm	—	0.1 nm	Text Exact Reported	7 (journal p. 775) · 3.1.4 Ex-situ investigation into microscopic surface morphology, thickness and lateral size · Fig. 5k
Surface roughness Ra for HITP-Ni-NS_240 minMarked as a best value within this paper	3.6(3) nm	—	0.3 nm	Text Exact Reported	7 (journal p. 775) · 3.1.4 Ex-situ investigation into microscopic surface morphology, thickness and lateral size · Fig. 5o
Thickness-1 for HITP-Ni-NS_120 minMarked as a best value within this paper	8.4(3) nm	—	0.3 nm	Text Exact Reported	7 (journal p. 775) · 3.1.4 Ex-situ investigation into microscopic surface morphology, thickness and lateral size · Fig. 5r
Thickness-1 for HITP-Ni-NS_180 min	7.6(3) nm	—	0.3 nm	Text Exact Reported	7 (journal p. 775) · 3.1.4 Ex-situ investigation into microscopic surface morphology, thickness and lateral size · Fig. 5s
Thickness-1 for HITP-Ni-NS_1 min	3.4(1) nm	—	0.1 nm	Text Exact Reported	7 (journal p. 775) · 3.1.4 Ex-situ investigation into microscopic surface morphology, thickness and lateral size · Fig. 5p
Thickness-1 for HITP-Ni-NS_240 min	6.8(3) nm	—	0.3 nm	Text Exact Reported	7 (journal p. 775) · 3.1.4 Ex-situ investigation into microscopic surface morphology, thickness and lateral size · Fig. 5t
Thickness-1 for HITP-Ni-NS_60 min	4.1(5) nm	—	0.5 nm	Text Exact Reported	7 (journal p. 775) · 3.1.4 Ex-situ investigation into microscopic surface morphology, thickness and lateral size · Fig. 5q
Thickness-2 for HITP-Ni-NS_120 minMarked as a best value within this paper	14.9(6) nm	—	0.6 nm	Text Exact Reported	7 (journal p. 775) · 3.1.4 Ex-situ investigation into microscopic surface morphology, thickness and lateral size · Fig. 5r
Thickness-2 for HITP-Ni-NS_180 min	12.2(3) nm	—	0.3 nm	Text Exact Reported	7 (journal p. 775) · 3.1.4 Ex-situ investigation into microscopic surface morphology, thickness and lateral size · Fig. 5s
Thickness-2 for HITP-Ni-NS_240 min	13.0(6) nm	—	0.6 nm	Text Exact Reported	7 (journal p. 775) · 3.1.4 Ex-situ investigation into microscopic surface morphology, thickness and lateral size · Fig. 5t
Thickness-3 for HITP-Ni-NS_240 minMarked as a best value within this paper	22.0(9) nm	—	0.9 nm	Text Exact Reported	7 (journal p. 775) · 3.1.4 Ex-situ investigation into microscopic surface morphology, thickness and lateral size · Fig. 5t

High-resolution transmission electron microscopy with FFT

Transmission electron microscopy

HITP-Ni-NS_1 min · Nanosheet

Representative HITP-Ni-NS_1 min, 60 min and 240 min samples deposited on Cu 200 mesh grids with support films.

Temperature: room temperature
Atmosphere: in vacuo
Geometry: Cu 200 mesh grids with support films
Context: standing-time series
Measurement source: 8-9 (journal pp. 776-777) · 3.1.5 Ex-situ investigations into crystal domains · Fig. 6

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Lateral crystallite size for HITP-Ni-NS_1 min	~10 nm	—	—	Text Approximate	8-9 (journal pp. 776-777) · 3.1.5 Ex-situ investigations into crystal domains · Fig. 6b
Lateral crystallite size for HITP-Ni-NS_240 min	~25 nm	—	—	Text Approximate	8-9 (journal pp. 776-777) · 3.1.5 Ex-situ investigations into crystal domains · Fig. 6j
Lateral crystallite size for HITP-Ni-NS_60 minMarked as a best value within this paper	~50 nm	—	—	Text Approximate	8-9 (journal pp. 776-777) · 3.1.5 Ex-situ investigations into crystal domains · Fig. 6f

3 measurement groups · 22 results