Microscopy Morphology — Highly conducting two-dimensional copper(i) 4-hydroxythiophenolate network

3 measurement groups · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

drop-cast CuAT thin film on bottom-contact FET · Thin Film

SEM image of bottom-contact FET fabricated with drop-cast CuAT film.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
CuAT FET morphology	uniform and continuous thin film between source and drain electrodes	—	—	Text Qualitative	2 · CuAT FET discussion · Fig. 2(ii)

drop-cast CuHT crystallites on bottom-contact FET · Thin Film

Top-view SEM of CuHT platy crystallites on bottom-contact FET.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
CuHT FET crystallite size maximum	25 um2	—	—	Text Exact Reported	2 · FET discussion · Fig. 2(i)
CuHT FET crystallite size minimum	0.25 um2	—	—	Text Exact Reported	2 · FET discussion · Fig. 2(i)
CuHT FET crystallite thickness	about 50 nm	—	about	Text Approximate	2 · FET discussion · Fig. 2(i)

polycrystalline CuHT yellow powder · Powder

FEI Philips Tecnai 20 TEM; individual platy crystallite viewed along [100].

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
solid morphology	micrometre-sized aggregated platy crystallites with thickness ca. 50 nm	—	ca.	Text Approximate	3 · conclusion · Fig. 1(ii), Fig. 2(i)
SAED inter-planar distance	3.93 A	—	—	Text Exact Reported	1 · XRD/TEM discussion · Fig. 1(ii)