cMOF Evidence Base
Diffraction Structure — Beyond diffusion: ion and electron migration contribute to charge transport in redox-conducting metal-organic frameworks

Measurement evidence

Diffraction Structure

Beyond diffusion: ion and electron migration contribute to charge transport in redox-conducting metal-organic frameworks · Johnson B.A., Castner A.T., Agarwala H. et al. · Chemical Science · 2025 · 5214-5222

1 measurement group · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM cross-section/top-down imaging and grazing-incidence PXRD

X-ray diffraction and scatteringScanning electron microscopy

Zn(NDI)@FTO thin film · Thin Film

SEM at 3 kV; PXRD with Cu Kalpha (lambda = 0.15418 nm), 45 kV and 40 mA, parallel beam optics

Geometry
thin film on FTO
Context
pristine framework thin film
Measurement source
p003 / SI page S3 · Materials and methods · Figure S4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
1D channel width16 A wide 1D channels——Text
Rounded Reported		p003 / journal page 5216 · Results and discussion
film thicknessMarked as a best value within this paperdf approximately 1 um—approximatelyCaption
Approximate		p025 / SI page S25 · Figures · Figure S4
FTO substrate PXRD peak2theta = 26.5 degrees——Caption
Rounded Reported		p025 / SI page S25 · Figures · Figure S4
Zn(NDI) PXRD peak2theta = 10.3 degrees——Caption
Rounded Reported		p025 / SI page S25 · Figures · Figure S4
Zn(NDI) PXRD peak2theta = 5.1 degrees——Caption
Rounded Reported		p025 / SI page S25 · Figures · Figure S4