Diffraction Structure — Highly Porous, Electrically Conductive Two-Dimensional Nickel–Hexaaminodehydrobenzoannulene Frameworks

Measurement evidence

Diffraction Structure

Highly Porous, Electrically Conductive Two-Dimensional Nickel–Hexaaminodehydrobenzoannulene Frameworks · Ohkubo E., Suzuki M., Aizawa N. et al. · Journal of the American Chemical Society · 2025 · 31940-31951

6 measurement groups · 15 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

2D GIWAXS

Ni3(HI12)2 film on interdigitated Au electrodes · Thin Film

beamline BL19B2 at SPring-8; 12.398 keV, incident angle 0.12 deg; 30 s exposure

Geometry
thin film
Context
pristine_framework
Measurement source
S27-S28 · S2-13 · Figures S20-S23
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
film packing compared with powderfilm packing structures identical to corresponding powder samplesText
Qualitative
S27-S28 · S2-13 · Figure S23

2D GIWAXS

Ni3(HI18)2 film on interdigitated Au electrodes · Thin Film

beamline BL19B2 at SPring-8; 12.398 keV, incident angle 0.12 deg; 30 s exposure

Geometry
thin film
Context
pristine_framework
Measurement source
S27-S28 · S2-13 · Figures S20-S23
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
film packing compared with powderfilm packing structures identical to corresponding powder samplesText
Qualitative
S27-S28 · S2-13 · Figure S23

2D GIWAXS

Ni3(HITP)2 film on interdigitated Au electrodes · Thin Film

beamline BL19B2 at SPring-8; 12.398 keV, incident angle 0.12 deg; 30 s exposure

Geometry
thin film
Context
pristine_framework
Measurement source
S27-S28 · S2-13 · Figures S20-S23
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
film packing compared with powderfilm packing structures identical to corresponding powder samplesText
Qualitative
S27-S28 · S2-13 · Figure S23

PXRD with Rietveld refinement

Ni3(HI12)2 activated powder · Powder

Cu Kalpha, 2theta 1-30 deg, P6/mmm AA-stacking model refinement

Geometry
powder
Context
pristine_framework
Measurement source
S2 · S1-1 General information
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
a=b lattice parameter2.68 nm (26.78 A in SI Table S3)SI Table
Exact Reported
S17 · S2-4 · Table S3
c lattice parameter0.333 nm (3.33 A)SI Table
Exact Reported
S17 · S2-4 · Table S3
100 peak FWHM0.51 degText
Rounded Reported
31944 · Preparation and Structure of MOFs · Figure 2b
Rwp AA refinement11.3%SI Table
Exact Reported
S17 · S2-4 · Table S3

PXRD with Rietveld refinement

Ni3(HI18)2 activated powder · Powder

Cu Kalpha, 2theta 1-30 deg, P6/mmm AA-stacking model refinement

Geometry
powder
Context
pristine_framework
Measurement source
S2 · S1-1 General information
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
a=b lattice parameter3.19 nm (31.86 A in SI Table S3)SI Table
Exact Reported
S17 · S2-4 · Table S3
c lattice parameter0.331 nm (3.31 A)SI Table
Exact Reported
S17 · S2-4 · Table S3
100 peak FWHM0.40 degText
Rounded Reported
31944 · Preparation and Structure of MOFs · Figure 2c
Rwp AA refinement10.5%SI Table
Exact Reported
S17 · S2-4 · Table S3

PXRD with Rietveld refinement

Ni3(HITP)2 activated powder · Powder

Cu Kalpha, 2theta 1-30 deg, P6/mmm AA-stacking model refinement

Geometry
powder
Context
pristine_framework
Measurement source
S2 · S1-1 General information
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
a=b lattice parameter2.68 nm (21.74 A in SI Table S3)Text
Rounded Reported
31943 · Preparation and Structure of MOFs · Figure 2; Table S3
c lattice parameter0.33 nm (3.32 A in SI Table S3)Text
Rounded Reported
31943 · Preparation and Structure of MOFs · Figure 2; Table S3
100 peak FWHM0.42 degText
Rounded Reported
31944 · Preparation and Structure of MOFs · Figure 2a
Rwp AA refinement12.9%SI Table
Exact Reported
S17 · S2-4 · Table S3