Measurement evidence
Highly Porous, Electrically Conductive Two-Dimensional Nickel–Hexaaminodehydrobenzoannulene Frameworks · Ohkubo E., Suzuki M., Aizawa N. et al. · Journal of the American Chemical Society · 2025 · 31940-31951
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
Ni3(HI12)2 activated powder · Powder
EPR spectra at 300 K; powders activated at 60 C under vacuum for 2 h
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| g-factor | g = 2.00 | — | — | Text Exact Reported | 31947 · Electronic Properties · Figure 5h |
Ni3(HI18)2 activated powder · Powder
EPR spectra at 300 K; powders activated at 60 C under vacuum for 2 h
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| g-factor | g = 2.00 | — | — | Text Exact Reported | 31947 · Electronic Properties · Figure 5i |
Ni3(HITP)2 activated powder · Powder
EPR spectra at 300 K; powders activated at 60 C under vacuum for 2 h
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| 300 K EPR signal | no signal | — | — | Qualitative Qualitative | 31947 · Electronic Properties · Figure 5g |
Ni3(HI12)2 film on ITO/glass · Thin Film
thin-film samples on ITO/glass substrates
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| ionisation energyMarked as a best value within this paper | 4.46 eV | — | — | Text Exact Reported | 31946 · Electronic Properties · Figure 5e |
Ni3(HI18)2 film on ITO/glass · Thin Film
thin-film samples on ITO/glass substrates
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| ionisation energy | 4.90 eV | — | — | Text Exact Reported | 31946 · Electronic Properties · Figure 5f |
Ni3(HITP)2 film on ITO/glass · Thin Film
thin-film samples on ITO/glass substrates
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| ionisation energy | 4.66 eV | — | — | Text Exact Reported | 31946 · Electronic Properties · Figure 5d |
Ni3(HI12)2 film on fused silica · Thin Film
MOF films on fused-silica substrates; broad profiles extending to 2000 nm or beyond
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| optical band gapMarked as a best value within this paper | 0.37 eV | — | — | Text Exact Reported | 31946 · Electronic Properties · Figure 5b |
Ni3(HI18)2 film on fused silica · Thin Film
MOF films on fused-silica substrates; broad profiles extending to 2000 nm or beyond
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| optical band gap | 0.59 eV | — | — | Text Exact Reported | 31946 · Electronic Properties · Figure 5c |
Ni3(HITP)2 film on fused silica · Thin Film
MOF films on fused-silica substrates; broad profiles extending to 2000 nm or beyond
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| optical band gap | 0.52 eV | — | — | Text Exact Reported | 31946 · Electronic Properties · Figure 5a |
Ni3(HI12)2 activated powder · Powder
PHI 5000 Versaprobe II, Al source; C 1s calibrated to 284.8 eV
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ni 2p1/2 binding energy | 872.6 eV | — | — | Text Exact Reported | S19 · S2-7 · Figure S9 |
| Ni 2p3/2 binding energy | 855.4 eV | — | — | Text Exact Reported | S19 · S2-7 · Figure S9 |
| N 1s anilinic amine peak | 399.7 eV | — | — | Text Exact Reported | S19 · S2-7 · Figures S9b,S10b |
| N 1s quinoid imine peak | 397.9 eV | — | — | Text Exact Reported | S19 · S2-7 · Figures S9b,S10b |
Ni3(HI18)2 activated powder · Powder
PHI 5000 Versaprobe II, Al source; C 1s calibrated to 284.8 eV
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ni 2p1/2 binding energy | 872.2 eV | — | — | Text Exact Reported | S19 · S2-7 · Figure S10 |
| Ni 2p3/2 binding energy | 855.2 eV | — | — | Text Exact Reported | S19 · S2-7 · Figure S10 |