powder X-ray diffraction
Cu-F/Hs powder/nanoparticles · Powder
Cu-F/Hs XRD pattern compared with simulated Cu-F/Hs pattern after baseline correction and fitting.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| XRD peak assigned to (012) | 15.5 degrees 2theta | — | — | Text Exact Reported | 5 · 3.1 · Fig. 2D |
| XRD peak assigned to (-104) | 27.06 degrees 2theta | — | — | Text Exact Reported | 5 · 3.1 · Fig. 2D |