rotation electron diffraction plus powder X-ray diffraction Rietveld refinement
Ag-BHT nanocrystals exfoliated from film · Unknown
PXRD collected with Cu Kalpha radiation, 40 kV and 40 mA, 2theta 5.0-120.0 degrees, 0.013 degree step, 406 s per step; RED used for 3D reciprocal lattice reconstruction.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Ag-Ag bond length | 2.88 A | — | — | Text Exact Reported | p002 / 15154 · Results and discussion · Figure S6 |
| Ag-Ag bond length | 3.03 A | — | — | Text Exact Reported | p002 / 15154 · Results and discussion · Figure S6 |
| Ag-Ag bond length | 3.13 A | — | — | Text Exact Reported | p002 / 15154 · Results and discussion · Figure S6 |
| unit-cell a | 15.1168(19) A | — | (19) | SI Table Exact Reported | S20 · Table S1 · Table S1 |
| unit-cell b | 9.1042(13) A | — | (13) | SI Table Exact Reported | S20 · Table S1 · Table S1 |
| unit-cell beta angle | 110.430(3) degrees | — | (3) | SI Table Exact Reported | S20 · Table S1 · Table S1 |
| unit-cell c | 4.2776(6) A | — | (6) | SI Table Exact Reported | S20 · Table S1 · Table S1 |
| unit-cell volume | 551.67(13) A^3 | — | (13) | SI Table Exact Reported | S20 · Table S1 · Table S1 |
| refined chemical formula | Ag5C6S6 | — | — | SI Table Exact Reported | S20 · Table S1 · Table S1 |
| interlayer distance of 2D networks | 7.0 A | — | — | Text Rounded Reported | p002 / 15154 · Results and discussion · Figure 3 |
| Rietveld Rp | 3.45% | — | — | SI Table Exact Reported | S20 · Table S1 · Table S1 |
| Rietveld Rwp | 4.98% | — | — | SI Table Exact Reported | S20 · Table S1 · Table S1 |
| space group | I2/m | — | — | SI Table Exact Reported | S20 · Table S1 · Table S1 |