XPS, EPMA, ICP-OES, elemental analysis
free-standing Ag-BHT film · Thin Film
EPMA with JEOL JXA-8100; carbon by Flash EA 1112; silver by ICP-OES after dissolving samples in fuming nitric acid.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| found Ag mass percent | Ag 66.97% | — | — | Text Exact Reported | S4 · Synthesis of Ag-BHT film |
| found C mass percent | C 9.01% | — | — | Text Exact Reported | S4 · Synthesis of Ag-BHT film |
| found S mass percent | S 24.02% | — | — | Text Exact Reported | S4 · Synthesis of Ag-BHT film |
| EPMA Ag/S atom ratio sample 1 | 0.8201 | — | — | SI Table Exact Reported | S20 · Table S2 · Table S2 |
| EPMA Ag/S atom ratio sample 2 | 0.8132 | — | — | SI Table Exact Reported | S20 · Table S2 · Table S2 |
| EPMA Ag/S atom ratio sample 3 | 0.8494 | — | — | SI Table Exact Reported | S20 · Table S2 · Table S2 |