Diffraction Structure — Processable UiO-66 Metal-Organic Framework Fluid Gel and Electrical Conductivity of Its Nanofilm with Sub-100 nm Thickness

4 measurement groups · 9 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

MOF-801 thin film · Thin Film

MOF-801 fluid gel/film characterised after applying UiO-66 spin-coating parameters.

Geometry: thin film on glass
Context: pristine MOF-801 generality sample
Measurement source: p005 / 30848 · Results and Discussion · Figure 4c; Figure S6a

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
MOF-801 film morphology	smooth surface by SEM	—	—	Text Qualitative	p005 / 30848 · Results and Discussion · Figure 4c
MOF-801 structure after fluid-gel processing	structure preserved in fluid gel state by GIXRD	—	—	Text Qualitative	p005 / 30848 · Results and Discussion · Figure S6a

MOF-808 thin film · Thin Film

MOF-808 fluid gel/film characterised after applying UiO-66 spin-coating parameters.

Geometry: thin film on glass
Context: pristine MOF-808 generality sample
Measurement source: p005 / 30848 · Results and Discussion · Figure 4d; Figure S6b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
MOF-808 film morphology	smooth surface by SEM	—	—	Text Qualitative	p005 / 30848 · Results and Discussion · Figure 4d
MOF-808 structure after fluid-gel processing	structure preserved in fluid gel state by GIXRD	—	—	Text Qualitative	p005 / 30848 · Results and Discussion · Figure S6b

60 nm UiO-66 nanofilm · Thin Film

60 nm UiO-66 thin film before device fabrication and after chronoamperometry measurement for 3600 s.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
GIXRD structural stability after chronoamperometry	corresponded peak retained before and after 3600 s chronoamperometry	—	—	Text Qualitative	p006 / 30849 · Results and Discussion · Figure S14

UiO-66 nanofilm thickness series · Thin Film

Thin films and fluid gels measured by GIXRD with grazing incidence angle 0.10 degrees, 4 s step^-1, 0.01 degree step.

Geometry: thin films on glass
Context: pristine UiO-66 fluid gel and thin films
Measurement source: p002-p004 / 30845-30847 · Materials and Methods; Results and Discussion · Figure 3c; Figure S5

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
defect-site-associated diffraction peak	2theta = 12.0 degrees	—	—	Text Rounded Reported	p004 / 30847 · Results and Discussion · Figure 3c
UiO-66 fluid-gel crystallite size by GIXRD Scherrer equation	10 nm	—	—	Text Rounded Reported	p004 / 30847 · Results and Discussion · Figure 3d
UiO-66 (111) d-spacing range	11.5-12.0 A	—	—	Text Range	p004 / 30847 · Results and Discussion · Figure 3c
major UiO-66 diffraction peak	2theta = 7.4 degrees indexed as (111)	—	—	Text Rounded Reported	p004 / 30847 · Results and Discussion · Figure 3c