Microscopy Morphology — Processable UiO-66 Metal-Organic Framework Fluid Gel and Electrical Conductivity of Its Nanofilm with Sub-100 nm Thickness

Measurement evidence

Microscopy Morphology

Processable UiO-66 Metal-Organic Framework Fluid Gel and Electrical Conductivity of Its Nanofilm with Sub-100 nm Thickness · Somjit V., Thinsoongnoen P., Waiprasoet S. et al. · ACS Applied Materials and Interfaces · 2021 · 30844-30852

4 measurement groups · 11 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Noncontact AFM using Park Systems NX10

80 nm UiO-66 nanofilm · Thin Film

Olympus OMCLA160TS cantilever; 80 and 150 nm UiO-66 films compared with same height scale.

Geometry
thin films on substrate
Context
pristine UiO-66 nanofilms
Measurement source
p006 / SI p6 · Supporting Information · Figure S10
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
RMS roughness, 150 nm film22 nmText
Exact Reported
p006 / SI p6 · Figure S10 caption · Figure S10
RMS roughness, 80 nm filmMarked as a best value within this paper13 nmText
Exact Reported
p006 / SI p6 · Figure S10 caption · Figure S10

SEM, optical images, and HRTEM/SAED

UiO-66 fluid gel · Unknown

SEM samples sputtered with Pt for 60 s; TEM samples dispersed in ethanol and drop-cast onto carbon-film copper grids.

Atmosphere
ambient drying for TEM preparation
Context
fluid gel compared with powder and nonflowing gel controls
Measurement source
p002-p004 / 30845-30847 · Materials and Methods; Results and Discussion · Figures 2 and 3d
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
mean particle size by HRTEMapproximately 10 nmText
Approximate
p004 / 30847 · Results and Discussion · Figure 3d
SAED d-spacing11.8 AText
Exact Reported
p004 / 30847 · Results and Discussion · Figure 3d
fluid-gel particle size by SEMsmaller than 100 nmupper boundText
Approximate
p003 / 30846 · Results and Discussion · Figure 2c
fluid-gel colloidal stabilitystable for at least 1 monthat leastText
Rounded Reported
p003 / 30846 · Results and Discussion · Figure 2d
microcrystalline powder average crystal size500 nmText
Rounded Reported
p003 / 30846 · Results and Discussion · Figure 2a

TEM and GIXRD particle-size/crystallite-size analysis

UiO-66 nanofilm thickness series · Thin Film

Particle size of UiO-66 as a function of film thickness determined by TEM and GIXRD.

Geometry
spin-coated films
Context
pristine UiO-66 nanofilms
Measurement source
p006 / SI p6 · Supporting Information · Figure S11
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource

Cross-sectional SEM thickness measurement

UiO-66 nanofilm thickness series · Thin Film

Films prepared from UiO-66 fluid gel in DI water at 0.025-0.500 g mL^-1 and spin speeds 1000-5000 rpm for 60 s.

Geometry
spin-coated films on cleaned glass
Context
pristine UiO-66 thin films
Measurement source
p004 / 30847 · Results and Discussion · Figure 4; Figure S4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
minimum concentration for full substrate coveragehigher than 0.100 g mL-1threshold higher than valueText
Approximate
p004 / 30847 · Results and Discussion · Figure 4; Figure S4
film thickness at 1000 rpm for 0.1 g mL-1 fluid gel80 nm at 1000 rpmText
Rounded Reported
p004 / 30847 · Results and Discussion · Figure 4a,b; Figure S4
film thickness at 5000 rpm for 0.1 g mL-1 fluid gelMarked as a best value within this paper40 nm at 5000 rpmText
Rounded Reported
p004 / 30847 · Results and Discussion · Figure 4b; Figure S4a
controllable film thickness range40 to 150 nmText
Range
p004 / 30847 · Results and Discussion · Figure 4; Figure S4