| Silver(I) oxide plus DPSe no-reaction controlresearch_0737__mat__mat_silver_oxide | Powder · Pristine Control · Unknown | Ag2O exposed to DPSe; no [AgSePh]inf product observed | S-2 · Figure S1 caption · Figure S1c,d |
| Silver metal plus benzeneselenol delamination/side-product controlresearch_0737__mat__mat_silver_metal | Thin Film · Pristine Control · Unknown | Treating silver metal with PhSeH under oxygen-free or oxygen-containing conditionsSilver wafer/film on silicon substrate | 13897 · Substitution of DPSe with PhSeH · Table 1 |
| [AgSePh]inf film from 100 nm Ag on silicon under humidity variantsresearch_0737__mat__mat_agseph_mithrene | Thin Film · Target Sample · Pristine Framework | Tarnished in dry, room-air, or water-saturated vessel at 80 deg C for 72 hSilicon wafer with 100 nm thermally evaporated Ag · 100 nm Ag precursor; product thickness not directly reported | 13894 · Water's Role in Silver Tarnishing by Diphenyl Diselenide · Figure 4 |
| [AgSePh]inf progression films from 200 nm Agresearch_0737__mat__mat_agseph_mithrene | Thin Film · Target Sample · Pristine Framework | Tarnished at 80 deg C and examined after 1, 3, 4, 7, and/or 8 daysThermally evaporated 200 nm silver film · 200 nm Ag precursor; mature cross-section approximately 255 nm after 8 days | 13895 · Progression of the Tarnishing Reaction · Figure 5 |
| [AgSePh]inf from silver(I) oxide plus benzeneselenolresearch_0737__mat__mat_agseph_mithrene | Powder · Target Sample · Pristine Framework | Acid-base reaction of Ag2O with neat PhSeH at 80 deg C, followed by ethanol/isopropanol purification | 13897 · Substitution of Silver(0) with Silver(I) Oxide · Equation 5; Table 1 |
| Bulk reference [AgSePh]inf powder/crystalsresearch_0737__mat__mat_agseph_mithrene | Powder · Pristine Control · Pristine Framework | Gram-scale solution synthesis from AgNO3, PPh3, DPSe, THF, and diethyl ether; isolated canary-yellow powder | 13899 · Materials and Methods |
| [AgSePh]inf thin films on glass coverslipsresearch_0737__mat__mat_agseph_mithrene | Thin Film · Target Sample · Pristine Framework | Gas-phase tarnishing for 3 days; silver is limiting reagent for optical measurementsGlass coverslips with 1, 2, 3, 5, or 10 nm deposited Ag precursor · 1-10 nm Ag precursor; estimated [AgSePh]inf layers 4, 8, 12, 20, and 39 layers | 13896 · Thin Films on Glass Substrates for Optical Characterization · Figure 7 |
| Solution-grown [AgSePh]inf crystallitesresearch_0737__mat__mat_agseph_mithrene | Single Crystal · Pristine Control · Pristine Framework | Solution-grown crystallites used for SEM/PL morphology and optical comparisonPrepared by previously reported solution-phase/biphasic liquid-liquid method | 13893 · Results and Discussion · Figure 3a,b |
| Tarnished [AgSePh]inf thin film on silverresearch_0737__mat__mat_agseph_mithrene | Thin Film · Target Sample · Pristine Framework | Solvent-free gas-phase DPSe tarnishing of silver at 80 deg C for 24-192 h in sealed glass jar, stored dark after reactionThermally evaporated silver film on substrates including silicon, glass, quartz, or mica; Ti adhesion layer often used before Ag · Product film thicknesses ranging from 5 to 100 nm reported in abstract; specific experiments also used 100 nm or 200 nm Ag precursor films. | 13892 · Abstract |
| Low-yield [AgSePh]inf from silver films immersed in DPSe/tolueneresearch_0737__mat__mat_agseph_mithrene | Thin Film · Target Sample · Composite | Silver films immersed in DPSe in toluene for three days; low yield [AgSePh]inf plus fibrous byproduct100 nm or 5 nm Ag film on silicon wafer · 100 nm Ag or 5 nm Ag precursor in SI examples | S-3 · Figure S2 caption · Figure S2 |
| Thin Ag on Si(100) etch/no-reaction controlresearch_0737__mat__mat_silver_metal | Thin Film · Pristine Control · Unknown | Attempted humidity-rich tarnishing; competing Ag/water/silicon etching observedSi(100) with discontinuous 1-10 nm Ag, including 10 nm Ag in SI EDS · 1-10 nm Ag on Si(100); 10 nm Ag in Figure S6 | S-5 · Figure S5 caption · Figure S5 |
| Untarnished silver control filmsresearch_0737__mat__mat_silver_metal | Thin Film · Pristine Control · Unknown | Thermally evaporated Ag before DPSe conversion, or heated control without DPSeSilicon or glass substrates depending on experiment · 1-10 nm, 100 nm, or 200 nm Ag precursor depending on experiment | 13896 · Thin Films on Glass Substrates for Optical Characterization · Figure 7b,c |