Spectroscopy — Tarnishing Silver Metal into Mithrene

Measurement evidence

Spectroscopy

Tarnishing Silver Metal into Mithrene · Trang B., Yeung M., Popple D.C. et al. · Journal of the American Chemical Society · 2018 · 13892-13903

5 measurement groups · 12 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Confocal emission maps and photoluminescence spectra

[AgSePh]inf thin films on glass coverslips · Thin Film

Confocal maps with 405 nm excitation; representative PL spectra for glass coverslip films of varying Ag precursor thickness

Geometry
Glass-supported ultrathin films
Context
Pristine [AgSePh]inf films on glass
Measurement source
S-4 · Figure S3 caption · Figure S3; Figure S4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Confocal-map excitation wavelength405 nm405 nmCaption
Exact Reported
S-4 · Figure S3 caption · Figure S3
Uniform blue emission wavelength in SI glass-film mapsMarked as a best value within this paper467 nm467 nmCaption
Exact Reported
S-4 · Figure S3 caption · Figure S3
SI Figure S4 peak intensity versus silver thickness fitR2 = 0.91060.9106Figure Axis
Approximate
S-4 · Figure S4 · Figure S4b

Photoluminescence spectroscopy and confocal PL microscopy

Tarnished [AgSePh]inf thin film on silver · Thin Film

PL emission spectra of solution-grown [AgSePh]inf crystals and tarnished films; excitation wavelength 350-380 nm for spectrometer measurements

Context
Pristine [AgSePh]inf film compared with solution-grown pristine crystallites
Measurement source
13893 · Results and Discussion · Figure 3b,d,e
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Photoluminescence emission peak of tarnished filmsMarked as a best value within this paper467 nm467 nmText
Exact Reported
13893 · Results and Discussion · Figure 3e

Confocal microscopy and emission spectroscopy

Low-yield [AgSePh]inf from silver films immersed in DPSe/toluene · Thin Film

Silver films immersed in DPSe/toluene for three days; local blue luminescent product analysed

Geometry
Ag film on silicon wafer
Context
Impure low-yield [AgSePh]inf with fibrous byproduct
Measurement source
S-3 · Figure S2 caption · Figure S2b,c,e,f
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Emission peak from low-yield toluene immersion product467 nm467 nmCaption
Exact Reported
S-3 · Figure S2 caption · Figure S2c,f

UV-visible absorption spectroscopy in transmission mode

[AgSePh]inf thin films on glass coverslips · Thin Film

Absorption spectra of glass-supported films before and after 3 days tarnishing; Ag precursor thicknesses 1-10 nm

Geometry
Transmission through glass coverslips
Context
Pristine [AgSePh]inf thin films compared with unreacted Ag films
Measurement source
13896 · Thin Films on Glass Substrates for Optical Characterization · Figure 7b,c
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Linear fit of 434 nm absorption versus [AgSePh]inf layersMarked as a best value within this paperr2 = 0.9980.998Text
Exact Reported
13896 · Thin Films on Glass Substrates for Optical Characterization · Figure 7c inset
[AgSePh]inf density used in film-thickness conversion estimate2.7 g/cm32.7 g/cm3Text
Exact Reported
13896 · Thin Films on Glass Substrates for Optical Characterization
Absorption feature used for layer-count scalingMarked as a best value within this paper434 nm434 nmText
Exact Reported
13896 · Thin Films on Glass Substrates for Optical Characterization · Figure 7c
Large-area film size>6 cm26 cm2Text
Approximate
13892 · Abstract
Silver density used in film-thickness conversion estimate10.5 g/cm310.5 g/cm3Text
Exact Reported
13896 · Thin Films on Glass Substrates for Optical Characterization

UV-vis diffuse reflectance spectroscopy

[AgSePh]inf film from 100 nm Ag on silicon under humidity variants · Thin Film

Diffuse reflectance spectra of control, dry, room-air, and air-plus-water tarnishing experiments on silicon-supported 100 nm Ag films

Atmosphere
Dry/Drierite, room air, or water-saturated reaction vessel during synthesis
Geometry
Reflectance from thin films on silicon
Context
Pristine [AgSePh]inf tarnished films compared with no-DPSe and dry controls
Measurement source
13894 · Water's Role in Silver Tarnishing by Diphenyl Diselenide · Figure 4e
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Absorption peak in tarnished humidity-test samplesMarked as a best value within this paper434 nm434 nmText
Exact Reported
13894 · Water's Role in Silver Tarnishing by Diphenyl Diselenide · Figure 4e
Dry atmosphere inactivates tarnishing reactiondesiccated and control samples nearly indistinguishable by optical reflectivityText
Qualitative
13894 · Water's Role in Silver Tarnishing by Diphenyl Diselenide · Figure 4e