Diffraction Structure — Tarnishing Silver Metal into Mithrene

3 measurement groups · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

GIWAXS on ultrathin glass-supported films

X-ray diffraction and scattering

[AgSePh]inf thin films on glass coverslips · Thin Film

GIWAXS spectra of 4, 8, 12, and 20 layer [AgSePh]inf films on glass; basal-plane reflections resolved

Geometry: Ultrathin film grazing-incidence geometry
Context: Pristine ultrathin [AgSePh]inf films after conversion from Ag
Measurement source: 13896 · Thin Films on Glass Substrates for Optical Characterization · Figure 7d,e

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Residual silver in converted glass films	no evidence for residual silver particles	—	—	Text Qualitative	13896 · Thin Films on Glass Substrates for Optical Characterization · Figure 7d,e

GIWAXS linecuts and 2D GIWAXS images

X-ray diffraction and scattering

[AgSePh]inf progression films from 200 nm Ag · Thin Film

GIWAXS progression of [AgSePh]inf tarnishing reaction over 1, 3, and 7/8 days; basal-plane reflections and residual metallic silver tracked

Geometry: Thin film grazing-incidence geometry
Context: Pristine [AgSePh]inf growing from Ag metal precursor
Measurement source: 13896 · Progression of the Tarnishing Reaction · Figure 6

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
(002) reflection scattering wavevectorMarked as a best value within this paper	8.78 nm-1	8.78 nm-1	—	Text Exact Reported	13896 · Progression of the Tarnishing Reaction · Figure 6a,b
Metallic Ag GIWAXS feature	around 27 nm-1	27 nm-1	—	Text Approximate	13896 · Progression of the Tarnishing Reaction · Figure 6

Synchrotron grazing-incidence wide-angle X-ray scattering (GIWAXS)

X-ray diffraction and scattering

Tarnished [AgSePh]inf thin film on silver · Thin Film

Beamline 7.3.3, 10 keV photon energy, wavelength 0.12398 nm, 0.15 deg incident angle, ca. 300 mm sample-detector distance, Pilatus 2-M detector; compared tarnished film, bulk powder, and calculated reference pattern

Geometry: Thin film on substrate in grazing-incidence geometry
Context: Pristine tarnished film compared with pristine bulk powder
Measurement source: 13894 · Results and Discussion · Figure 3f

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Prominent basal-plane reflections	(002), (004), and (006)	—	—	Text Qualitative	13894 · Results and Discussion · Figure 3f
Higher-q reflection threshold	>15 nm-1	15 nm-1	—	Text Approximate	13894 · Results and Discussion · Figure 3f