Microscopy Morphology — Upgrading Structural Conjugation in Three-Dimensional Ni-Based Metal-Organic Frameworks for Promoting Electrical Conductivity and Specific Capacitance

Measurement evidence

Microscopy Morphology

Upgrading Structural Conjugation in Three-Dimensional Ni-Based Metal-Organic Frameworks for Promoting Electrical Conductivity and Specific Capacitance · Tai H., Ding W., Zhang X. et al. · Inorganic Chemistry · 2024 · 18083-18091

2 measurement groups · 3 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM and EDS mapping

Scanning electron microscopy Elemental microanalysis and mapping

as-synthesised Ni-BPE crystals · Single Crystal

SEM Regulus-8100; images at 100 um, 5 um, 1 um scales; EDS C/N/O/Ni mapping

Geometry: crystals
Context: pristine target MOF
Measurement source: p. 18087 · UV-Vis Spectra, Electrical Conductivity, BET, and SEM Characterization · Figure 3e-h

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
EDS element distribution	uniform distribution of C, N, O, and Ni	—	—	Text Qualitative	p. 18088 · UV-Vis Spectra, Electrical Conductivity, BET, and SEM Characterization · Figure 3h
Crystal lateral dimensions	approximately 100 x 30 um	—	—	Text Approximate	p. 18087 · UV-Vis Spectra, Electrical Conductivity, BET, and SEM Characterization · Figure 3e-g

SEM and EDS mapping

Scanning electron microscopy Elemental microanalysis and mapping

as-synthesised Ni-BPY crystals · Single Crystal

SEM Regulus-8100; images at 100 um, 5 um, 1 um scales; EDS C/N/O/Ni mapping

Geometry: crystals
Context: pristine control MOF
Measurement source: p. 18087 · UV-Vis Spectra, Electrical Conductivity, BET, and SEM Characterization · Figure 3a-d

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Crystal lateral dimensions	approximately 40 x 40 um	—	—	Text Approximate	p. 18087 · UV-Vis Spectra, Electrical Conductivity, BET, and SEM Characterization · Figure 3a-c