Diffraction Structure — Conductive Lanthanide Metal-Organic Frameworks with Exceptionally High Stability

Measurement evidence

Diffraction Structure

Conductive Lanthanide Metal-Organic Frameworks with Exceptionally High Stability · Chen C.-L., Wang C., Zheng X.-Y. et al. · Journal of the American Chemical Society · 2023 · 16983-16987

6 measurement groups · 29 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

PXRD after MnO4- adsorption/exchange

Gd4-MOF after MnO4- anion exchange · Single Crystal

as-synthesised versus after adsorption with MnO4-

Atmosphere
ambient
Geometry
single crystals/powder
Context
guest-loaded framework
Measurement source
16 · Figure S28 text · Figure S28
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
structure after MnO4- exchangePXRD suggests structure did not changeText
Qualitative
16 · Figure S28 text · Figure S28

powder X-ray diffraction

as-synthesised Gd4-MOF single crystals · Single Crystal

as-synthesised Gd4-MOF compared with simulated PXRD

Atmosphere
ambient
Geometry
powder/crystals
Context
pristine framework
Measurement source
2 · PXRD characterisation · Figure 1d
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD phase matchexperimental and theoretical values perfectly matchText
Qualitative
2 · PXRD characterisation · Figure 1d

single-crystal X-ray diffraction

as-synthesised Gd4-MOF single crystals · Single Crystal

Cu Kalpha radiation, 100 or 256 K; SHELXTL-97 refinement

Temperature
100 or 256
Atmosphere
not specified
Geometry
single crystal
Context
pristine framework
Measurement source
2 · 3 Single-crystal X-ray structure determination · Table S4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
unit-cell a parameter21.2864parenthetical standard uncertainty in sourceSI Table
Exact Reported
20 · Crystal data · Table S4
unit-cell b parameter21.2864parenthetical standard uncertainty in sourceSI Table
Exact Reported
20 · Crystal data · Table S4
unit-cell c parameter6.3322parenthetical standard uncertainty in sourceSI Table
Exact Reported
20 · Crystal data · Table S4
unit-cell volume2484.79parenthetical standard uncertainty in sourceSI Table
Exact Reported
20 · Crystal data · Table S4
free channel diameter14.5 AText
Exact Reported
2 · Structure description · Figures 1a, 1c, S4, and S5
calculated crystal density2.06SI Table
Exact Reported
20 · Crystal data · Table S4
formula weight1541.59SI Table
Exact Reported
20 · Crystal data · Table S4
hydrogen-bonding interaction distance2.750 AText
Exact Reported
2 · Structure description · Figure 1c
pi-pi stacking distance3.351 AText
Exact Reported
2 · Structure description · Figure 1c
space groupP63mcSI Table
Exact Reported
20 · Crystal data · Table S4

PXRD after pH/boiling-water treatment

as-synthesised Gd4-MOF single crystals · Single Crystal

Gd4-MOF immersed in pH 1 HCl, pH 12 NaOH, water 100 C, and stored 2 years; Tm/Lu pH 1 and 12 in SI

Atmosphere
aqueous acid/base/water
Geometry
bulk crystals
Context
treated pristine framework
Measurement source
3 · Stability evaluation · Figure 3a and Figures S19-S21
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD retention after harsh solution treatmentNo noticeable changes after boiling water, acidic/basic solution, and 2-year storageText
Qualitative
3 · Stability evaluation · Figure 3a and Figures S19-S21

single-crystal X-ray diffraction

as-synthesised Lu4-MOF single crystals · Single Crystal

Cu Kalpha radiation, 100 or 256 K; SHELXTL-97 refinement

Temperature
100 or 256
Atmosphere
not specified
Geometry
single crystal
Context
pristine framework
Measurement source
2 · 3 Single-crystal X-ray structure determination · Table S4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
unit-cell a parameter21.2218parenthetical standard uncertainty in sourceSI Table
Exact Reported
20 · Crystal data · Table S4
unit-cell b parameter21.2218parenthetical standard uncertainty in sourceSI Table
Exact Reported
20 · Crystal data · Table S4
unit-cell c parameter6.2635parenthetical standard uncertainty in sourceSI Table
Exact Reported
20 · Crystal data · Table S4
unit-cell volume2442.94parenthetical standard uncertainty in sourceSI Table
Exact Reported
20 · Crystal data · Table S4
calculated crystal density2.192SI Table
Exact Reported
20 · Crystal data · Table S4
formula weight1612.46SI Table
Exact Reported
20 · Crystal data · Table S4
pi-pi stacking distance3.335 AFigure Axis
Rounded Reported
2 · Figure 2 · Figure 2c
space groupP63mcSI Table
Exact Reported
20 · Crystal data · Table S4

single-crystal X-ray diffraction

as-synthesised Tm4-MOF single crystals · Single Crystal

Cu Kalpha radiation, 100 or 256 K; SHELXTL-97 refinement

Temperature
100 or 256
Atmosphere
not specified
Geometry
single crystal
Context
pristine framework
Measurement source
2 · 3 Single-crystal X-ray structure determination · Table S4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
unit-cell a parameter21.2118parenthetical standard uncertainty in sourceSI Table
Exact Reported
20 · Crystal data · Table S4
unit-cell b parameter21.2118parenthetical standard uncertainty in sourceSI Table
Exact Reported
20 · Crystal data · Table S4
unit-cell c parameter6.265parenthetical standard uncertainty in sourceSI Table
Exact Reported
20 · Crystal data · Table S4
unit-cell volume2441.22parenthetical standard uncertainty in sourceSI Table
Exact Reported
20 · Crystal data · Table S4
calculated crystal density2.161SI Table
Exact Reported
20 · Crystal data · Table S4
formula weight1588.33SI Table
Exact Reported
20 · Crystal data · Table S4
pi-pi stacking distance3.321 AFigure Axis
Rounded Reported
2 · Figure 2 · Figure 2c
space groupP63mcSI Table
Exact Reported
20 · Crystal data · Table S4