Atomic force microscopy (AFM)
Cu-HHTP-NSs · Nanosheet
AFM image and height profile of as-obtained Cu-HHTP-NSs.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Cu-HHTP-NS lateral area | 0.8-1.2 um2 | — | — | Text Range | 3 · 3.1. Characterization · Fig. 1a |
| Cu-HHTP-NS arithmetic average roughness | 1.23 nm | — | — | Text Exact Reported | 3 · 3.1. Characterization · Fig. 1b; Figure S1 |
| Cu-HHTP-NS thickness | 3.59 +/- 0.36 nm | — | +/- 0.36 nm | Text Exact Reported | 3 · 3.1. Characterization · Fig. 1a-b |