cMOF Evidence Base
Diffraction Structure — Radiation-Induced in Situ Construction of 2D Conductive Defect-Rich Metal-Organic Frameworks for High-Performance Supercapacitor

Measurement evidence

Diffraction Structure

Radiation-Induced in Situ Construction of 2D Conductive Defect-Rich Metal-Organic Frameworks for High-Performance Supercapacitor · Zhang K., Mao X., Yan W. et al. · Small · 2025 · e07135

2 measurement groups · 9 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

PXRD with Rietveld refinement

X-ray diffraction and scattering

Cu-CAT-Rad · Powder

Cu Kalpha PXRD; P6/m refinement

Context
pristine target framework
Measurement source
2-3 · Results and Discussion · Figure 1b
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
PXRD peak positions2theta = 4.8, 9.6, 12.6, and 28.6 deg——Text
Rounded Reported		2 · Results and Discussion · Figure S1
Rietveld lattice parameter a=ba = b = 21.57 A——Text
Rounded Reported		2 · Results and Discussion · Figure 1b
Rietveld lattice parameter cc = 6.53 A——Text
Rounded Reported		2 · Results and Discussion · Figure 1b
Rietveld RpRp = 2.89%——Text
Rounded Reported		2 · Results and Discussion · Figure 1b
Rietveld RwpRwp = 3.10%——Text
Rounded Reported		2 · Results and Discussion · Figure 1b

PXRD with Rietveld refinement

X-ray diffraction and scattering

Cu-CAT-Sol · Powder

Cu Kalpha PXRD; P6/m refinement

Context
pristine control framework
Measurement source
2-3 · Results and Discussion · Figure 1c
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Rietveld lattice parameter a=ba = b = 21.33 A——Text
Rounded Reported		2 · Results and Discussion · Figure 1c
Rietveld lattice parameter cc = 6.49 A——Text
Rounded Reported		2 · Results and Discussion · Figure 1c
Rietveld RpRp = 1.69%——Text
Rounded Reported		2 · Results and Discussion · Figure 1c
Rietveld RwpRwp = 1.95%——Text
Rounded Reported		2 · Results and Discussion · Figure 1c