Electrical Transport — Radiation-Induced in Situ Construction of 2D Conductive Defect-Rich Metal-Organic Frameworks for High-Performance Supercapacitor

2 measurement groups · 8 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu-CAT-Rad/NF electrode · Electrode

EIS fitted with Zeview2.0; Nyquist and Warburg analysis

Geometry: three-electrode Ni-foam electrode
Context: composite electrode containing target framework
Measurement source: 7 · Results and Discussion · Figure 4g,h; Figures S32-S35; Table S4

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cl- ion diffusion coefficient	1.53 x 10-7 cm2 s-1	—	—	Text Rounded Reported	7 · Results and Discussion · Figure S35
Reported interface transfer / series resistance	2.69 Ohm	—	—	Text Rounded Reported	7 · Results and Discussion · Figure 4g; Table S4
Charge transfer resistance Rct	8.89 Ohm	—	—	SI Table Rounded Reported	20 · Section S4 · Table S4
EIS-derived resistivity / Warburg slope term	0.67 Ohm s^1/2	—	—	Text Rounded Reported	7 · Results and Discussion · Figure 4h

Cu-CAT-Sol/NF electrode · Electrode

EIS fitted with Zeview2.0; Nyquist and Warburg analysis

Geometry: three-electrode Ni-foam electrode
Context: composite electrode containing control framework
Measurement source: 7 · Results and Discussion · Figure 4g,h; Figures S32-S35; Table S4

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cl- ion diffusion coefficient	3.05 x 10-8 cm2 s-1	—	—	Text Rounded Reported	7 · Results and Discussion · Figure S35
Reported interface transfer / series resistance	2.84 Ohm	—	—	Text Rounded Reported	7 · Results and Discussion · Figure 4g; Table S4
Charge transfer resistance Rct	18.1 Ohm	—	—	SI Table Rounded Reported	20 · Section S4 · Table S4
EIS-derived resistivity / Warburg slope term	1.56 Ohm s^1/2	—	—	Text Rounded Reported	7 · Results and Discussion · Figure 4h