Li L., Zhang S., Lu Y. et al. · Advanced Materials · 2021 · 2104120
Open a family to keep every result attached to its sample, method and conditions.
Paraphrased for this database from the authors’ stated interpretations — never quoted verbatim — and kept separate from reported measurements.
Cu-TCPP IC-MOF is the best-performing material in this IC-MOF series for volatile sulphur compound detection.
Caveat: Best within the tested materials and conditions, not a universal ranking across all possible IC-MOFs.
main p.2 · Introduction · Linked to 5 structured results
The high selectivity arises from strong analyte-film interactions and comes at the cost of reusability because the response is irreversible.
Caveat: Authors argue disposability is acceptable due to facile preparation and low cost.
main p.2 · Introduction · Linked to 3 structured results
The organic ligand affects irreversible response; stable structure and larger pore size are proposed to favour binding of mobile metal ions and VSC detection.
Caveat: Pore-size/functionality relationship is inferred from a small ligand set, and pore-size measurement method is not specified in the SI table.
main p.7 · Results and Discussion · Table S2 · Linked to 5 structured results
H2S detection forms CuS through strong interaction with Cu2+, reducing mobile ion concentration and capacitance.
Caveat: Mechanism is supported by post-detection XPS and solubility-product arguments; no operando measurement is reported.
main p.6 · Results and Discussion · Figure 5 · Linked to 5 structured results
In IC-MOF sensors, surplus/mobile metal cations act as main ionic charge carriers, enabling capacitive chemical sensing under AC voltage.
Caveat: The paper does not report direct ionic conductivity values; mechanism is inferred from device behaviour and residual metal salt discussion.
main p.4 · Results and Discussion · Linked to 2 structured results
Names and aliases are kept exactly within the paper’s own identity model.
| Material | Composition | Structure context | Source |
|---|---|---|---|
| Co-TCPP IC-MOF | Not specifiedCo divalent metal ions from a specific cobalt nitrate solution · TCPP = 5,10,15,20-tetrakis(4-carboxyphenyl)porphyrin | 2D · PristineM-TCPP comparison IC-MOF thin film; XPS and UV-vis used to verify analogous IC-MOF formation. | main p.4 · Results and Discussion · Figure 3c; Figure S2 |
| Cu-BTEC IC-MOF | Not specifiedCu ions/Cu nitrate-derived copper nodes · BTEC = 1,2,4,5-benzenetetracarboxylic acid, from H4BTEC | unknown · PristineCu-carboxylate ligand-control IC-MOF thin film. | main p.4 · Results and Discussion · Figure 3d; Figure S3 |
| Cu-TCPP IC-MOF | Not specifiedCu ions/Cu nitrate-derived copper nodes with mobile Cu2+ ionic charge carriers · TCPP = 5,10,15,20-tetrakis(4-carboxyphenyl)porphyrin, from H2TCPP | 2D · PristineIonically conductive multilayer Cu-porphyrin MOF thin film with out-of-plane (001)/(002) reflections; residual copper salt/mobile Cu2+ contributes ionic capacitance. | main p.2 · Introduction/Results · Figure 1 |
| Cu-THPP IC-MOF | Not specifiedCu ions/Cu nitrate-derived copper nodes · THPP = 5,10,15,20-tetrakis(4-hydroxyphenyl)porphyrin, from H2THPP | 2D · PristineCu-porphyrin ligand-control IC-MOF thin film. | main p.4 · Results and Discussion · Figure 3d; Figure S3 |
| Metal sulfide reference set | CuS, CoS, NiS, ZnS, MgSCu, Co, Ni, Zn, Mg sulfides · not applicable | unknown · Model SystemReference solubility-product values used to explain selectivity. | main p.7 · Results and Discussion · Table 2 |
| Mg-TCPP IC-MOF | Not specifiedMg divalent metal ions from a specific magnesium nitrate solution · TCPP = 5,10,15,20-tetrakis(4-carboxyphenyl)porphyrin | 2D · PristineM-TCPP comparison IC-MOF thin film; XPS and UV-vis used to verify analogous IC-MOF formation. | main p.4 · Results and Discussion · Figure 3c; Figure S2 |
| Ni-TCPP IC-MOF | Not specifiedNi divalent metal ions from a specific nickel nitrate solution · TCPP = 5,10,15,20-tetrakis(4-carboxyphenyl)porphyrin | 2D · PristineM-TCPP comparison IC-MOF thin film; XPS and UV-vis used to verify analogous IC-MOF formation. | main p.4 · Results and Discussion · Figure 3c; Figure S2 |
| Zn-TCPP IC-MOF | Not specifiedZn divalent metal ions from a specific zinc nitrate solution · TCPP = 5,10,15,20-tetrakis(4-carboxyphenyl)porphyrin | 2D · PristineM-TCPP comparison IC-MOF thin film; XPS and UV-vis used to verify analogous IC-MOF formation. | main p.4 · Results and Discussion · Figure 3c; Figure S2 |
Sample form, processing state and composition status define the context for measurements.
| Sample | Form and role | Processing and geometry | Source |
|---|---|---|---|
| Co-TCPP IC-MOF thin-film sensorresearch_0826__mat__co_tcpp_ic_mof | Electrode · Pristine Control · Pristine Framework | Liquid-interface sprayed thin film on ITOConductive glass with ITO interdigital electrodes | SI p.5 · Supporting Figure Captions · Figure S2 |
| Cu-BTEC IC-MOF thin-film sensorresearch_0826__mat__cu_btec_ic_mof | Electrode · Pristine Control · Pristine Framework | Liquid-interface sprayed thin film on ITOConductive glass with ITO interdigital electrodes | SI p.6 · Supporting Figure Captions · Figure S3 |
| Cu-TCPP IC-MOF 100 nm thickness variantresearch_0826__mat__cu_tcpp_ic_mof | Electrode · Pristine Control · Pristine Framework | Prepared by controlling the amount of sprayed ligand solutionConductive glass with ITO interdigital electrodes · 100 nm | SI p.14 · Supporting Figure Captions · Figure S11 |
| Cu-TCPP IC-MOF 200 nm thickness variantresearch_0826__mat__cu_tcpp_ic_mof | Electrode · Pristine Control · Pristine Framework | Prepared by controlling the amount of sprayed ligand solutionConductive glass with ITO interdigital electrodes · 200 nm | SI p.14 · Supporting Figure Captions · Figure S11 |
| Cu-TCPP IC-MOF 300 nm thickness variantresearch_0826__mat__cu_tcpp_ic_mof | Electrode · Pristine Control · Pristine Framework | Prepared by controlling the amount of sprayed ligand solutionConductive glass with ITO interdigital electrodes · 300 nm | SI p.14 · Supporting Figure Captions · Figure S11 |
| Cu-TCPP IC-MOF thin-film sensor on ITO interdigital electrodesresearch_0826__mat__cu_tcpp_ic_mof | Electrode · Target Sample · Pristine Framework | Liquid-interface sprayed thin film deposited on ITO, vacuum heated at 80 C for 2 hConductive glass with indium tin oxide (ITO) interdigital electrodes · about 220 nm Cu-TCPP IC-MOF layer; ITO electrodes 185 nm | main p.3 · Results and Discussion · Figure 1c; Figure 2f |
| Cu-THPP IC-MOF thin-film sensorresearch_0826__mat__cu_thpp_ic_mof | Electrode · Pristine Control · Pristine Framework | Liquid-interface sprayed thin film on ITOConductive glass with ITO interdigital electrodes | SI p.6 · Supporting Figure Captions · Figure S3 |
| Metal sulfide pKsp reference valuesresearch_0826__mat__metal_sulfide_reference_set | Model · Model System · Model | Literature/reference comparison table used for mechanism discussion | main p.7 · Results and Discussion · Table 2 |
| Mg-TCPP IC-MOF thin-film sensorresearch_0826__mat__mg_tcpp_ic_mof | Electrode · Pristine Control · Pristine Framework | Liquid-interface sprayed thin film on ITOConductive glass with ITO interdigital electrodes | SI p.5 · Supporting Figure Captions · Figure S2 |
| Ni-TCPP IC-MOF thin-film sensorresearch_0826__mat__ni_tcpp_ic_mof | Electrode · Pristine Control · Pristine Framework | Liquid-interface sprayed thin film on ITOConductive glass with ITO interdigital electrodes | SI p.5 · Supporting Figure Captions · Figure S2 |
| Zn-TCPP IC-MOF thin-film sensorresearch_0826__mat__zn_tcpp_ic_mof | Electrode · Pristine Control · Pristine Framework | Liquid-interface sprayed thin film on ITOConductive glass with ITO interdigital electrodes | SI p.5 · Supporting Figure Captions · Figure S2 |