Diffraction Structure — Highly Selective and Sensitive Detection of Volatile Sulfur Compounds by Ionically Conductive Metal-Organic Frameworks

Measurement evidence

Diffraction Structure

Highly Selective and Sensitive Detection of Volatile Sulfur Compounds by Ionically Conductive Metal-Organic Frameworks · Li L., Zhang S., Lu Y. et al. · Advanced Materials · 2021 · 2104120

1 measurement group · 2 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Out-of-plane X-ray diffraction

X-ray diffraction and scattering

Cu-TCPP IC-MOF thin-film sensor on ITO interdigital electrodes · Electrode

Cu-TCPP IC-MOF thin film

Geometry: thin film on ITO
Context: pristine Cu-TCPP IC-MOF
Measurement source: main p.3 · Results and Discussion · Figure 2d

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-TCPP out-of-plane XRD (001) peak	001 reflection at about 12.8 degrees 2theta	—	—	Figure Axis Approximate	main p.3 · Results and Discussion · Figure 2d
Cu-TCPP out-of-plane XRD (002) peak	002 reflection at about 26.4 degrees 2theta	—	—	Figure Axis Approximate	main p.3 · Results and Discussion · Figure 2d