Microscopy Morphology — Highly Selective and Sensitive Detection of Volatile Sulfur Compounds by Ionically Conductive Metal-Organic Frameworks

2 measurement groups · 5 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Cu-TCPP IC-MOF thin-film sensor on ITO interdigital electrodes · Electrode

Surface and cross-section SEM of Cu-TCPP IC-MOF thin-film sensor

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu-TCPP IC-MOF layer thickness	about 220 nm	—	—	Text Approximate	main p.3 · Results and Discussion · Figure 2f
ITO interdigital electrode thickness	185 nm	—	—	Text Exact Reported	main p.3 · Results and Discussion · Figure 2f

Cu-TCPP IC-MOF 100 nm thickness variant · Electrode

AFM images of IC-MOF films and thickness variants of 100, 200, and 300 nm

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
AFM Cu-TCPP thickness variant	100 nm	—	—	Caption Rounded Reported	SI p.14 · Supporting Figure Captions · Figure S11
AFM Cu-TCPP thickness variant	200 nm	—	—	Caption Rounded Reported	SI p.14 · Supporting Figure Captions · Figure S11
AFM Cu-TCPP thickness variant	300 nm	—	—	Caption Rounded Reported	SI p.14 · Supporting Figure Captions · Figure S11