cMOF Evidence Base
Diffraction Structure — Benign preparation of metal–organic frameworks of trimesic acid and Cu, Co or Ni for potential sensor applications

Measurement evidence

Diffraction Structure

Benign preparation of metal–organic frameworks of trimesic acid and Cu, Co or Ni for potential sensor applications · Sel K., Demirci S., Meydan E. et al. · Journal of Electronic Materials · 2015 · 136-143

3 measurement groups · 70 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Powder X-ray diffraction (XRD)

X-ray diffraction and scattering

TMA-Co(II) powder · Powder

Ultima IV Rigaku diffractometer on powdered TMA-M samples; peak analysis reported in Table I.

Context
Pristine TMA-M powder
Measurement source
p004-p005 · MOF Characterization · Fig. 3; Table I
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
XRD peak 1 2theta17.5 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 1 d-spacing5.064 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 1 FWHM0.46 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 1 height39 cps——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 1 crystallite size184 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 2theta18.69 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 d-spacing4.744 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 FWHM0.48 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 height95 cps——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 crystallite size174 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 2theta27.1 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 d-spacing3.287 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 FWHM0.69 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 height30 cps——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 crystallite size124 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I

Powder X-ray diffraction (XRD)

X-ray diffraction and scattering

TMA-Cu(II) powder · Powder

Ultima IV Rigaku diffractometer on powdered TMA-M samples; peak analysis reported in Table I.

Context
Pristine TMA-M powder
Measurement source
p004-p005 · MOF Characterization · Fig. 3; Table I
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
XRD peak 1 2theta9.185 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 1 d-spacing9.621 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 1 FWHM0.145 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 1 height1404 cps——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 1 crystallite size572 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 2theta9.92 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 d-spacing8.909 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 FWHM0.224 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 height1540 cps——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 crystallite size372 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 2theta10.916 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 d-spacing8.098 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 FWHM0.219 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 height960 cps——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 crystallite size381 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 4 2theta13.532 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 4 d-spacing6.538 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 4 FWHM0.208 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 4 height1483 cps——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 4 crystallite size401 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 5 2theta17.015 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 5 d-spacing5.207 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 5 FWHM0.173 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 5 height736 cps——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 5 crystallite size486 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 6 2theta21.948 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 6 d-spacing4.046 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 6 FWHM0.255 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 6 height464 cps——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 6 crystallite size332 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 7 2theta27.322 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 7 d-spacing3.2614 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 7 FWHM0.242 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 7 height636 cps——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 7 crystallite size352 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 8 2theta28.456 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 8 d-spacing3.1341 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 8 FWHM0.269 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 8 height1339 cps——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 8 crystallite size318 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I

Powder X-ray diffraction (XRD)

X-ray diffraction and scattering

TMA-Ni(II) powder · Powder

Ultima IV Rigaku diffractometer on powdered TMA-M samples; peak analysis reported in Table I.

Context
Pristine TMA-M powder
Measurement source
p004-p005 · MOF Characterization · Fig. 3; Table I
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
XRD peak 1 2theta17.58 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 1 d-spacing5.041 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 1 FWHM0.191 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 1 height736 cps——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 1 crystallite size440 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 2theta18.727 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 d-spacing4.7346 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 FWHM0.433 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 height2088 cps——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 2 crystallite size194.1 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 2theta27.2 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 d-spacing3.276 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 FWHM0.33 deg——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 height572 cps——Table
Exact Reported		p005 · MOF Characterization · Table I
XRD peak 3 crystallite size261 Angstrom——Table
Exact Reported		p005 · MOF Characterization · Table I