Electrical Transport — Benign preparation of metal–organic frameworks of trimesic acid and Cu, Co or Ni for potential sensor applications

Measurement evidence

Electrical Transport

Benign preparation of metal–organic frameworks of trimesic acid and Cu, Co or Ni for potential sensor applications · Sel K., Demirci S., Meydan E. et al. · Journal of Electronic Materials · 2015 · 136-143

3 measurement groups · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Room-temperature current-voltage (I-V) conductivity measurement

TMA-Co(II) pressed MOF disk · Pellet

Pressed MOF disk dried at 70 deg C under vacuum for 12 h; transverse current path; Keithley 2400 electrometer; top and bottom conductive carbon-tape electrodes fully overlapping.

Temperature
room temperature
Atmosphere
not specified
Geometry
Pressed disk, about 1.12 cm2 area and about 1 mm thickness; top/bottom carbon tape electrodes
Context
Pristine pressed MOF disk, not a composite device except carbon-tape contacts
Measurement source
p004-p007 · Conductivity Analysis · Fig. 6; Fig. 7; Table IV
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Room-temperature electrical conductivity5.39 x 10^-9 +/- 4 x 10^-9 S/cm4 x 10^-9 S/cmTable
Exact Reported
p007 · Conductivity Measurements and Optical Analysis · Table IV
Approximate current at 100 V from I-V plotapproximately 1.5e-06 A at 100 VFigure Axis
Approximate
p007 · Conductivity Measurements and Optical Analysis · Fig. 7

Room-temperature current-voltage (I-V) conductivity measurement

TMA-Cu(II) pressed MOF disk · Pellet

Pressed MOF disk dried at 70 deg C under vacuum for 12 h; transverse current path; Keithley 2400 electrometer; top and bottom conductive carbon-tape electrodes fully overlapping.

Temperature
room temperature
Atmosphere
not specified
Geometry
Pressed disk, about 1.12 cm2 area and about 1 mm thickness; top/bottom carbon tape electrodes
Context
Pristine pressed MOF disk, not a composite device except carbon-tape contacts
Measurement source
p004-p007 · Conductivity Analysis · Fig. 6; Fig. 7; Table IV
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Room-temperature electrical conductivityMarked as a best value within this paper7.97 x 10^-7 +/- 5 x 10^-7 S/cm5 x 10^-7 S/cmTable
Exact Reported
p007 · Conductivity Measurements and Optical Analysis · Table IV
Approximate current at 100 V from I-V plotapproximately 0.0005 A at 100 VFigure Axis
Approximate
p007 · Conductivity Measurements and Optical Analysis · Fig. 7

Room-temperature current-voltage (I-V) conductivity measurement

TMA-Ni(II) pressed MOF disk · Pellet

Pressed MOF disk dried at 70 deg C under vacuum for 12 h; transverse current path; Keithley 2400 electrometer; top and bottom conductive carbon-tape electrodes fully overlapping.

Temperature
room temperature
Atmosphere
not specified
Geometry
Pressed disk, about 1.12 cm2 area and about 1 mm thickness; top/bottom carbon tape electrodes
Context
Pristine pressed MOF disk, not a composite device except carbon-tape contacts
Measurement source
p004-p007 · Conductivity Analysis · Fig. 6; Fig. 7; Table IV
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Room-temperature electrical conductivity2.65 x 10^-8 +/- 1 x 10^-8 S/cm1 x 10^-8 S/cmTable
Exact Reported
p007 · Conductivity Measurements and Optical Analysis · Table IV
Approximate current at 100 V from I-V plotapproximately 8e-06 A at 100 VFigure Axis
Approximate
p007 · Conductivity Measurements and Optical Analysis · Fig. 7