Dunn method CV scan-rate analysis
SKIER-5/Super P/PVDF electrode · Electrode
CV profiles from 0.1 to 1.0 mV s^-1; log(i) versus log(v); capacitive and diffusion-controlled contribution separation
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| capacitive contribution at 0.1 mV s^-1 | 44.3% | — | — | Figure Axis Rounded Reported | 21737 · Dunn method analysis · Figure 3c |
| capacitive contribution at 0.2 mV s^-1 | 44.7% | — | — | Text Rounded Reported | 21738 · Dunn method analysis · Figure 3d; Figure S15 |
| capacitive contribution at 0.4 mV s^-1 | 52.9% | — | — | Text Rounded Reported | 21738 · Dunn method analysis · Figure 3d; Figure S15 |
| capacitive contribution at 0.6 mV s^-1 | 55.3% | — | — | Text Rounded Reported | 21738 · Dunn method analysis · Figure 3d; Figure S15 |
| capacitive contribution at 0.8 mV s^-1 | 59.8% | — | — | Text Rounded Reported | 21738 · Dunn method analysis · Figure 3d; Figure S15 |
| capacitive contribution at 1.0 mV s^-1 | 63.8% | — | — | Text Rounded Reported | 21738 · Dunn method analysis · Figure 3d; Figure S15 |
| Dunn b-value peak a | 0.756 | — | — | Text Exact Reported | 21737 · Dunn method analysis · Figure 3b |
| Dunn b-value peak b | 0.764 | — | — | Text Exact Reported | 21737 · Dunn method analysis · Figure 3b |