Diffraction Structure — A highly sensitive AgNPs/Ni3(HHTP)2 SERS substrate for the detection of food additives and pesticide residues

Measurement evidence

Diffraction Structure

A highly sensitive AgNPs/Ni3(HHTP)2 SERS substrate for the detection of food additives and pesticide residues · Yuan Y., Zhou Z., Hao X. et al. · Physica Scripta · 2024 · 105604

1 measurement group · 1 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

X-ray powder diffraction

X-ray diffraction and scattering

rod-shaped Ni3(HHTP)2 film · Thin Film

SmartLab 9KW powder diffractometer.

Context: pristine Ni3(HHTP)2 conductive MOF
Measurement source: 5 · Characterization · Figure 3(b)

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Ni3(HHTP)2 XRD assigned diffraction peaks	4.6, 9.2, 13.8, and 26.9 deg assigned to (100), (200), (210), and (001)	—	—	Text Rounded Reported	4 · Characterization · Figure 3(b)