Microscopy Morphology — A highly sensitive AgNPs/Ni3(HHTP)2 SERS substrate for the detection of food additives and pesticide residues

4 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

rod-shaped Ni3(HHTP)2 film · Thin Film

EDX elemental map of Ni, O, and C in Ni3(HHTP)2.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
C atomic percentage	C 59.01 at%	—	—	Visual Estimate Rounded Reported	5 · Characterization · Figure 3(a)
Ni atomic percentage	Ni 15.36 at%	—	—	Visual Estimate Rounded Reported	5 · Characterization · Figure 3(a)
O atomic percentage	O 25.63 at%	—	—	Visual Estimate Rounded Reported	5 · Characterization · Figure 3(a)

PVP-modified monolayer AgNP film · Thin Film

SEM morphology and statistical analysis of 100 randomly selected Ag nanoparticles.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
average AgNP diameter	65.44 nm	65.44 nm	—	Text Rounded Reported	5 · Characterization · Figure 4(b)

AgNPs/Ni3(HHTP)2 SERS substrate on silicon wafer · Thin Film

SEM imaging of monolayer AgNP film and AgNPs/Ni3(HHTP)2 at different magnifications.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
AgNP monolayer loading on Ni3(HHTP)2	well-loaded with good contact	—	—	Qualitative Qualitative	7 · Characterization · Figure 5(b-d)

rod-shaped Ni3(HHTP)2 film · Thin Film

ZEISS Sigma 300 SEM; top-down and side-view imaging.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Ni3(HHTP)2 rod diameter	81.07 nm	81.07 nm	—	Text Rounded Reported	4 · Characterization · Figure 2
Ni3(HHTP)2 film thickness	approximately 1.28 um	1280 nm	—	Text Approximate	4 · Characterization · Figure 2