Diffraction Structure — Electro Fenton degradation of glyphosate by incrassated defect-free conductive Cu metal organic framework

Measurement evidence

Diffraction Structure

Electro Fenton degradation of glyphosate by incrassated defect-free conductive Cu metal organic framework · Xu W., Chen K., Yang Y. et al. · Process Safety and Environmental Protection · 2025 · 107991

3 measurement groups · 13 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

PXRD and Raman spectroscopy

10CAT-1 Film · Electrode

Out-of-plane PXRD compared with paper filter and simulated Cu-HHTP; Raman excited at 785 nm.

Atmosphere
ambient for Raman
Geometry
Cu-HHTP film on paper filter
Context
Cu-rich 10CAT-1 film on paper filter.
Measurement source
5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2a,b
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
10CAT-1 Film [001] peak half widthMarked as a best value within this paper0.23 degreesText
Exact Reported
5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2a
10CAT-1 Film [200] peak half widthMarked as a best value within this paper0.27 degreesText
Exact Reported
5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2a
10CAT-1 Film Raman ID/IG ratioMarked as a best value within this paper0.43Text
Exact Reported
5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2b
10CAT-1 Film Cu-HHTP [001] XRD peak25.8 degrees 2theta; later given as 25.67 degreestext gives 25.8 and 25.67Text
Rounded Reported
5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2a
Film Raman D-band-like peak1372 cm-1Text
Exact Reported
5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2b
Film Raman G-band-like peak1540 cm-1Text
Exact Reported
5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2b

PXRD and Raman spectroscopy

CAT-1 Film · Electrode

Out-of-plane PXRD compared with paper filter and simulated Cu-HHTP; Raman excited at 785 nm.

Atmosphere
ambient for Raman
Geometry
Cu-HHTP film on paper filter
Context
Lower-Cu CAT-1 film on paper filter.
Measurement source
5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2a,b
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
CAT-1 Film [001] peak half width0.41 degreesText
Exact Reported
5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2a
CAT-1 Film [200] peak half width0.56 degreesText
Exact Reported
5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2a
CAT-1 Film Raman ID/IG ratio0.52Text
Exact Reported
5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2b
CAT-1 Film Cu-HHTP [001] XRD peak25.5 degrees 2theta; later given as 25.49 degreestext gives 25.5 and 25.49Text
Rounded Reported
5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2a

X-ray diffraction using D8 ADVANCE, Cu Kalpha radiation

Cu-HHTP powder · Powder

Scan range 2theta = 5-90 degrees; powder pattern compared with simulated Cu-HHTP.

Context
Pristine Cu-HHTP powder structure.
Measurement source
3 · 2.4 Surface and elemental characterization · Fig. 1a
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu-HHTP powder XRD [001] peak28.51 degrees 2theta, assigned to [001]Text
Exact Reported
4 · 3.1 Characterization of Cu-HHTP powder · Fig. 1a
Cu-HHTP powder XRD [200] peak9.8 degrees 2theta, assigned to [200]Text
Rounded Reported
4 · 3.1 Characterization of Cu-HHTP powder · Fig. 1a
Cu-HHTP powder XRD [210] peak12.53 degrees 2theta, assigned to [210]Text
Exact Reported
4 · 3.1 Characterization of Cu-HHTP powder · Fig. 1a