PXRD and Raman spectroscopy
10CAT-1 Film · Electrode
Out-of-plane PXRD compared with paper filter and simulated Cu-HHTP; Raman excited at 785 nm.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| 10CAT-1 Film [001] peak half widthMarked as a best value within this paper | 0.23 degrees | — | — | Text Exact Reported | 5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2a |
| 10CAT-1 Film [200] peak half widthMarked as a best value within this paper | 0.27 degrees | — | — | Text Exact Reported | 5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2a |
| 10CAT-1 Film Raman ID/IG ratioMarked as a best value within this paper | 0.43 | — | — | Text Exact Reported | 5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2b |
| 10CAT-1 Film Cu-HHTP [001] XRD peak | 25.8 degrees 2theta; later given as 25.67 degrees | — | text gives 25.8 and 25.67 | Text Rounded Reported | 5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2a |
| Film Raman D-band-like peak | 1372 cm-1 | — | — | Text Exact Reported | 5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2b |
| Film Raman G-band-like peak | 1540 cm-1 | — | — | Text Exact Reported | 5 · 3.2 High Cu concentration induces crystallinity perfection · Fig. 2b |