Microscopy Morphology — Electro Fenton degradation of glyphosate by incrassated defect-free conductive Cu metal organic framework

3 measurement groups · 15 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

CAT-1 Film · Electrode

CAT-1 Film cross-section/surface morphology and surface EDS composition.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
CAT-1 Film EDS C fraction	23.6%	—	—	SI Table Exact Reported	12 · Supporting information · Table S2
CAT-1 Film EDS Cu fraction	41.8%	—	—	SI Table Exact Reported	12 · Supporting information · Table S2
CAT-1 Film EDS O fraction	34.6%	—	—	SI Table Exact Reported	12 · Supporting information · Table S2
CAT-1 Film average nanosphere size	0.95 um	—	—	Figure Axis Rounded Reported	11 · Supporting information · Fig. S7
CAT-1 Film layer thickness	approximately 1.08 um	—	approximately	Text Approximate	5 · 3.3 Surface investigation · Fig. S6b

Cu(OH)2 Network precursor on paper filter · Thin Film

Cu(OH)2 network precursor on paper filter; SI Figs. S5-S8 and Table S2.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Cu(OH)2 network EDS C fraction	3.1%	—	—	SI Table Exact Reported	12 · Supporting information · Table S2
Cu(OH)2 network EDS Cu fraction	50.1%	—	—	SI Table Exact Reported	12 · Supporting information · Table S2
Cu(OH)2 network EDS O fraction	46.8%	—	—	SI Table Exact Reported	12 · Supporting information · Table S2
Cu(OH)2 network precursor cross-section thickness	11.48 um	—	—	Figure Axis Rounded Reported	9 · Supporting information · Fig. S5
Cu(OH)2 network precursor average nanosphere size	0.43 um	—	—	Figure Axis Rounded Reported	11 · Supporting information · Fig. S7

10CAT-1 Film · Electrode

10CAT-1 Film morphology, cross-section thickness, surface size histogram and EDS composition from main Fig. 3 and SI Figs. S6-S8/Table S2.

Geometry: paper-supported films
Context: Morphology and elemental comparison of precursor/control/target films.
Measurement source: 6 · 3.3 Surface investigation · Fig. 3; SI Figs. S6-S8; Table S2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
10CAT-1 Film EDS C fractionMarked as a best value within this paper	25.4%	—	—	SI Table Exact Reported	12 · Supporting information · Table S2
10CAT-1 Film EDS Cu fractionMarked as a best value within this paper	45.1%	—	—	SI Table Exact Reported	12 · Supporting information · Table S2
10CAT-1 Film EDS O fraction	29.5%	—	—	SI Table Exact Reported	12 · Supporting information · Table S2
10CAT-1 Film average nanosphere size	1.52 um	—	—	Figure Axis Rounded Reported	11 · Supporting information · Fig. S7
10CAT-1 Film layer thicknessMarked as a best value within this paper	approximately 1.61 um	—	approximately	Text Approximate	5 · 3.3 Surface investigation · Fig. S6c