Powder/thin-film X-ray diffraction with BRUKER AXS D8 ADVANCE, Cu Kalpha
Ce-BTC thin films on glass, thickness series · Thin Film
Ce-BTC thin film on glass compared with simulated/previous Ce-BTC pattern.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| grain size of (130) crystal plane at 78 nm | ca. 40.5 nm | — | visual estimate from SI Figure S3 | Figure Axis Approximate | 3 · Supporting Information · Figure S3 |
| grain size of (130) crystal plane at 850 nmMarked as a best value within this paper | ca. 52 nm | — | visual estimate from SI Figure S3 | Figure Axis Approximate | 3 · Supporting Information · Figure S3 |
| Ce-BTC phase assignment from XRD | XRD peaks in good agreement with simulated peaks; Ce-BTC film obtained | — | — | Text Qualitative | 3 · Results and Discussion · Figure 1a |