Spectroscopic ellipsometry
RF-sputtered CuO precursor films · Thin Film
M-2000X or iSE Woollam instrument; optical modelling with CompleteEASE; CuO fitted using a B-spline model.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| CuO precursor thickness, Figure S5a | Thickness = 3.09 +/- 0.11 nm | — | +/- 0.11 nm | Figure Axis Rounded Reported | SI p.S10 · Results and Discussion · Figure S5a |
| CuO precursor thickness, Figure S5b | Thickness = 11.37 +/- 0.09 nm | — | +/- 0.09 nm | Figure Axis Rounded Reported | SI p.S10 · Results and Discussion · Figure S5b |