cMOF Evidence Base
Diffraction Structure — From 0D to 2D: Microwave-assisted synthesis of electrically conductive metal-organic frameworks with controlled morphologies

Measurement evidence

Diffraction Structure

From 0D to 2D: Microwave-assisted synthesis of electrically conductive metal-organic frameworks with controlled morphologies · Fang X., Choi J.Y., Lu C. et al. · Chemical Science · 2025 · 3168-3172

6 measurement groups · 9 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

PXRD peak full-width at half-maximum analysis at ca. 4.93 degrees.

X-ray diffraction and scattering

0D spherical Cu-HHTP powder · Powder

FWHM calculated from PXRD peak at ca. 4.93 degrees for 0D, 1D and 2D Cu-HHTP.

Geometry
Powder diffraction.
Context
Pristine powders.
Measurement source
SI p.S9 · Additional characterizations · Table S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
0D Cu-HHTP FWHM at 4.93 degrees0.38629 +/- 0.00831—+/- 0.00831SI Table
Exact Reported		SI p.S9 · Additional characterizations · Table S3

PXRD peak full-width at half-maximum analysis at ca. 4.93 degrees.

X-ray diffraction and scattering

1D rod-like Cu-HHTP powder · Powder

FWHM calculated from PXRD peak at ca. 4.93 degrees for 0D, 1D and 2D Cu-HHTP.

Geometry
Powder diffraction.
Context
Pristine powders.
Measurement source
SI p.S9 · Additional characterizations · Table S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
1D Cu-HHTP FWHM at 4.93 degrees0.38248 +/- 0.01028—+/- 0.01028SI Table
Exact Reported		SI p.S9 · Additional characterizations · Table S3

PXRD peak full-width at half-maximum analysis at ca. 4.93 degrees.

X-ray diffraction and scattering

2D sheet-like Cu-HHTP powder · Powder

FWHM calculated from PXRD peak at ca. 4.93 degrees for 0D, 1D and 2D Cu-HHTP.

Geometry
Powder diffraction.
Context
Pristine powders.
Measurement source
SI p.S9 · Additional characterizations · Table S3
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
2D Cu-HHTP FWHM at 4.93 degrees0.58857 +/- 0.00846—+/- 0.00846SI Table
Exact Reported		SI p.S9 · Additional characterizations · Table S3

Powder X-ray diffraction with Cu source; refined crystallographic data and PXRD comparison to simulated eclipsed Cu-HHTP.

X-ray diffraction and scattering

0D spherical Cu-HHTP powder · Powder

Rigaku SmartLab, Cu source lambda = 1.5418 Angstrom, 45 kV, 200 mA.

Geometry
Powder diffraction.
Context
Pristine powders; result rows include 0D, 1D and 2D samples.
Measurement source
SI p.S2 · Materials and characterizations
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
0D Cu-HHTP lattice parameter a21.11 A——SI Table
Exact Reported		SI p.S7 · Structural characterizations · Table S1
0D Cu-HHTP lattice parameter c3.35 A——SI Table
Exact Reported		SI p.S7 · Structural characterizations · Table S1
0D Cu-HHTP space groupP6/mmm——SI Table
Exact Reported		SI p.S7 · Structural characterizations · Table S1
PXRD phase assignment for 0D, 1D and 2D Cu-HHTPAll morphologies match simulated Cu-HHTP without impurities——Text
Qualitative		main p.3169 · Results and discussion · Fig. 1b, Fig. S5, Fig. S6, Table S1

Powder X-ray diffraction with Cu source; refined crystallographic data and PXRD comparison to simulated eclipsed Cu-HHTP.

X-ray diffraction and scattering

1D rod-like Cu-HHTP powder · Powder

Rigaku SmartLab, Cu source lambda = 1.5418 Angstrom, 45 kV, 200 mA.

Geometry
Powder diffraction.
Context
Pristine powders; result rows include 0D, 1D and 2D samples.
Measurement source
SI p.S2 · Materials and characterizations
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
1D Cu-HHTP lattice parameter a20.89 A——SI Table
Exact Reported		SI p.S7 · Structural characterizations · Table S1

Powder X-ray diffraction with Cu source; refined crystallographic data and PXRD comparison to simulated eclipsed Cu-HHTP.

X-ray diffraction and scattering

2D sheet-like Cu-HHTP powder · Powder

Rigaku SmartLab, Cu source lambda = 1.5418 Angstrom, 45 kV, 200 mA.

Geometry
Powder diffraction.
Context
Pristine powders; result rows include 0D, 1D and 2D samples.
Measurement source
SI p.S2 · Materials and characterizations
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
2D Cu-HHTP lattice parameter a20.98 A——SI Table
Exact Reported		SI p.S7 · Structural characterizations · Table S1