Powder X-ray diffraction (PXRD)
Ni-HHTP comparative sample set · Unknown
Detached electrosynthesised samples and solvothermal bulk compared with simulated/impurity references.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| Characteristic Ni-HHTP diffraction | Characteristic diffraction at 4.67 degrees 2 theta | — | — | Text Exact Reported | 51 · Results · Figure 3a |
| Hexagonal pore spacing from PXRD | 18.9 A hexagonal pore | — | — | Text Exact Reported | 51 · Results · Figure 3a |
| Absence of NiO/Ni(OH)2 diffraction impurities | No diffractions from NiO and Ni(OH)2 impurities observed | — | — | Text Qualitative | 51 · Results · Figure 3a |