AFM morphology, terrace height, thickness and roughness
As-grown Cu3(HHTP)2 MOF film on single-crystal Cu(100) anode · Thin Film
As-grown or transferred Cu3(HHTP)2 films; in-situ AFM for 10 x 10 mm regions on Cu foil.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| AFM terrace step height 1 | 3.5 nm | — | — | Text Rounded Reported | main p.2 · Characterisation · Figure 1f |
| AFM terrace step height 2 | 8.8 nm | — | — | Text Rounded Reported | main p.2 · Characterisation · Figure 1f |
| Upper limit of Cu3(HHTP)2 film thickness | about 60 nm; measured 59.79 nm | — | — | Caption Rounded Reported | SI p.S12 · Section 9 · Figure S11 |
| Average Ra roughness | Ra average 1.6 nm | — | — | Text Rounded Reported | SI p.S13 · Section 10 · Figure S12 |
| RMS roughness from AFM image | RMS roughness about 2.5 nm | — | — | Caption Approximate | SI p.S12 · Section 9 · Figure S11 |
| Average Rq roughness | Rq average 2.3 nm | — | — | Text Rounded Reported | SI p.S13 · Section 10 · Figure S12 |