SEM and TEM
pristine Cu-EP powder · Powder
SEM at 5 kV; TEM at 300 kV; TEM along [001] direction
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| aggregated nanocrystallite size | <100 nm | — | less than | Text Approximate | 203 · Structure characterization of Cu-EP · Figures 2E and S22 |
| TEM lattice distance along [001] | 2.36 nm | — | — | Text Exact Reported | 203 · Structure characterization of Cu-EP · Figure 2E |