Electrical Transport — Asymmetrical Substitution Manipulates Stacking Modes in 2D Conductive MOF Crystals

Measurement evidence

Electrical Transport

Asymmetrical Substitution Manipulates Stacking Modes in 2D Conductive MOF Crystals · Liu Y., Yao H., Zhang H. et al. · Journal of the American Chemical Society · 2025 · 48127-48135

6 measurement groups · 15 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Room-temperature four-probe electrical measurement

Cu3F2HHTP2 single-crystal device · Single Crystal

Single-crystal device; conductivity calculated from device resistance and cylindrical cross-section assumption.

Temperature
295
Atmosphere
ambient
Geometry
four-contact single-crystal rod/fibre device
Context
pristine target
Measurement source
6 · Results and Discussion · Figure S47; Table S4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3F2HHTP2 room-temperature single-crystal conductivityMarked as a best value within this paper1.51 S cm-1Text
Rounded Reported
6 · Results and Discussion · Figure S47; Table S4
Cu3F2HHTP2 device 3 ambient-air conductivity before cryostat0.77 S cm-1 under ambient conditionsText
Rounded Reported
82-83 · Figure S66 · Figure S66

Room-temperature four-probe electrical measurement

Cu3FHHTP2 single-crystal device · Single Crystal

Single-crystal device; conductivity calculated from device resistance and cylindrical cross-section assumption.

Temperature
295
Atmosphere
ambient
Geometry
four-contact single-crystal rod/fibre device
Context
pristine target
Measurement source
6 · Results and Discussion · Figure S46; Table S4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3FHHTP2 room-temperature single-crystal conductivityMarked as a best value within this paper0.21 S cm-1Text
Rounded Reported
6 · Results and Discussion · Figure S46; Table S4

Room-temperature four-probe electrical measurement

Cu3HHTP2 single-crystal device · Single Crystal

Single-crystal device; conductivity calculated from device resistance and cylindrical cross-section assumption.

Temperature
295
Atmosphere
ambient
Geometry
four-contact single-crystal rod/fibre device
Context
pristine control
Measurement source
6 · Results and Discussion · Figure S45; Table S4
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3HHTP2 room-temperature single-crystal conductivityMarked as a best value within this paper0.70 S cm-1Text
Rounded Reported
6 · Results and Discussion · Figure S45; Table S4

AC magnetic field Hall effect

Cu3F2HHTP2 Hall pellet · Pellet

AC-field Hall method using Lake Shore 8404 with 1.2 T RMS AC field; Van der Pauw pellet configuration.

Temperature
295
Geometry
compressed circular pellet, 6 mm diameter, connected to gold electrode with silver wire
Context
pristine MOF pellets
Measurement source
8 · Hall effect measurements · Figures S53-S58
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3F2HHTP2 carrier density2.72 x 10^19 cm-3Text
Rounded Reported
7 · Results and Discussion · Figure 5h
Cu3FHHTP2 carrier density1.58 x 10^18 cm-3Text
Rounded Reported
7 · Results and Discussion · Figure 5h
Cu3HHTP2 carrier densityMarked as a best value within this paper7.12 x 10^19 cm-3Text
Rounded Reported
7 · Results and Discussion · Figure 5h
Cu3F2HHTP2 Hall electron mobilityMarked as a best value within this paper0.051 cm2 V-1 s-1Text
Rounded Reported
6 · Results and Discussion · Figure 5h; Figures S53-S58
Cu3FHHTP2 Hall electron mobility0.014 cm2 V-1 s-1Text
Rounded Reported
6 · Results and Discussion · Figure 5h; Figures S53-S58
Cu3HHTP2 Hall electron mobility0.011 cm2 V-1 s-1Text
Rounded Reported
6 · Results and Discussion · Figure 5h; Figures S53-S58

OFET/OTFT mobility test of ligand thin films

FHHTP molecular crystal/model · Model

Top-contact/bottom-gate and top-gate/bottom-contact device processes; Keithley 4200 SCS under ambient conditions.

Temperature
295
Atmosphere
ambient, 22 degC, RH 50-60%
Geometry
ligand thin-film FETs
Context
ligand control, not MOF
Measurement source
7-8 · OFET devices fabrications and testing · Figure S35
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Ligand thin-film OFET mobilityno detectable hole or electron mobility for any of the three ligandsText
Qualitative
8 · OFET devices fabrications and testing · Figure S35

Variable-temperature DC resistance/conductivity

Cu3F2HHTP2 single-crystal device · Single Crystal

Autocube attoDRY 2100; 295 to 150 K at 5 K/min; activation energy extracted from linear fit of ln(sigma) versus 1/T.

Temperature
150-295
Atmosphere
cryostat/helium environment
Geometry
four-contact single-crystal devices bonded to chip with aluminium wire
Context
pristine MOF series
Measurement source
8 · Variable temperature electrical conductivity measurement · Figures S50-S52
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Cu3F2HHTP2 device 3 conductivity after cryostat placement0.02 S cm-1Text
Rounded Reported
82-83 · Figure S66 · Figure S66
Cu3F2HHTP2 activation energy122 meVText
Rounded Reported
6 · Results and Discussion · Figure 5d; Figures S50-S52
Cu3FHHTP2 activation energy161 meVText
Rounded Reported
6 · Results and Discussion · Figure 5d; Figures S50-S52
Cu3HHTP2 activation energy118 meVText
Rounded Reported
6 · Results and Discussion · Figure 5d; Figures S50-S52