Diffraction Structure — Highly Conductive 2D Metal-Organic Framework Thin Film Fabricated by Liquid-Liquid Interfacial Reaction Using One-Pot-Synthesized Benzenehexathiol

3 measurement groups · 8 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

Ag3BHT2 thin film · Thin Film

Rigaku TTRAX3 X-ray diffraction analyser, 15 kW, lambda = 1.541 A, 2theta = 5 to 35 deg.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Ag3BHT2 thin film (001) XRD peak	29.19 deg 2theta	—	—	Text Exact Reported	15758 · Materials Characterization · Figure 6
Ag3BHT2 thin film (100) XRD peak	9.48 deg 2theta	—	—	Text Exact Reported	15758 · Materials Characterization · Figure 6
Ag3BHT2 thin film (200) XRD peak	19.02 deg 2theta	—	—	Text Exact Reported	15758 · Materials Characterization · Figure 6
Ag3BHT2 thin film (210-bar) XRD peak	16.45 deg 2theta	—	—	Text Exact Reported	15758 · Materials Characterization · Figure 6
Ag3BHT2 thin film interlayer distance	3.06 A	—	—	Text Exact Reported	15758 · Materials Characterization · Figure 6
Ag3BHT2 thin film hexagonal lattice constant a=b	a = b = 10.77 A	—	—	Text Exact Reported	15758 · Materials Characterization · Figure 6

Au3BHT2 thin film · Thin Film

Rigaku TTRAX3 X-ray diffraction analyser, 15 kW, lambda = 1.541 A, 2theta = 5 to 35 deg.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Au3BHT2 thin film low crystallinity/disorder	weak intensity of peaks and lack of order diffraction signals	—	—	Text Qualitative	15758-15759 · Materials Characterization · Figure 6

Ag3BHT2 powder-pressed thick film · Pellet

Thick-film XRD shown in SI Figure S2.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Ag3BHT2 and Au3BHT2 thick films low crystallinity	XRD patterns are extremely weak	—	—	Text Qualitative	15759 · Materials Characterization · Figure S2