Spectroscopy — Highly Conductive 2D Metal-Organic Framework Thin Film Fabricated by Liquid-Liquid Interfacial Reaction Using One-Pot-Synthesized Benzenehexathiol

8 measurement groups · 27 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

1H NMR and ESI-MS

Nuclear magnetic resonance

BHT yellow solid · Powder

1H NMR at 400 MHz in CD3CN; ESI-MS with BHT dissolved in dichloromethane.

Context: ligand precursor
Measurement source: 15760-15761 · Experimental Methods · Figures S3-S4

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
BHT ESI-MS [M + 2H]2+	137.07	—	—	Text Exact Reported	15760 · Experimental Methods · Figure S4
BHT 1H NMR singlet	delta 2.09 ppm (s, 6H)	—	—	Text Exact Reported	15760 · Experimental Methods · Figure S3

energy-dispersive X-ray spectroscopy (EDS)

Elemental microanalysis and mapping

Ag3BHT2 thin film · Thin Film

Elemental analysis of Ag3BHT2 by EDS.

Context: pristine Ag3BHT2 film
Measurement source: S6 · Elemental analysis of Ag3BHT2 and Au3BHT2 · Table S1

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Ag3BHT2 EDS silver atomic percent experimental	13.68 at%	—	—	SI Table Exact Reported	S6 · Elemental analysis · Table S1
Ag3BHT2 EDS silver weight percent	44.82 wt%	—	—	SI Table Exact Reported	S6 · Elemental analysis · Table S1
Ag3BHT2 EDS carbon atomic percent experimental	45.17 at%	—	—	SI Table Exact Reported	S6 · Elemental analysis · Table S1
Ag3BHT2 EDS carbon weight percent	15.36 wt%	—	—	SI Table Exact Reported	S6 · Elemental analysis · Table S1
Ag3BHT2 EDS sulfur atomic percent experimental	42.15 at%	—	—	SI Table Exact Reported	S6 · Elemental analysis · Table S1
Ag3BHT2 EDS sulfur weight percent	39.82 wt%	—	—	SI Table Exact Reported	S6 · Elemental analysis · Table S1

energy-dispersive X-ray spectroscopy (EDS)

Elemental microanalysis and mapping

Au3BHT2 thin film · Thin Film

Elemental analysis of Au3BHT2 by EDS.

Context: pristine Au3BHT2 film
Measurement source: S6 · Elemental analysis of Ag3BHT2 and Au3BHT2 · Table S2

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Au3BHT2 EDS gold atomic percent experimental	8.67 at%	—	—	SI Table Exact Reported	S6 · Elemental analysis · Table S2
Au3BHT2 EDS gold weight percent	46.79 wt%	—	—	SI Table Exact Reported	S6 · Elemental analysis · Table S2
Au3BHT2 EDS carbon atomic percent experimental	49.17 at%	—	—	SI Table Exact Reported	S6 · Elemental analysis · Table S2
Au3BHT2 EDS carbon weight percent	16.19 wt%	—	—	SI Table Exact Reported	S6 · Elemental analysis · Table S2
Au3BHT2 EDS sulfur atomic percent experimental	42.16 at%	—	—	SI Table Exact Reported	S6 · Elemental analysis · Table S2
Au3BHT2 EDS sulfur weight percent	37.02 wt%	—	—	SI Table Exact Reported	S6 · Elemental analysis · Table S2

FT-IR spectroscopy

Infrared spectroscopy

BHT yellow solid · Powder

FT-IR spectra of BHT and thick films of Ag3BHT2 and Au3BHT2 acquired by PerkinElmer Spectrum 100.

Context: ligand and pristine MOF thick films
Measurement source: 15757 and 15761 · Materials Characterization · Figure 3

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
BHT S-H FTIR peak	2500 cm-1	—	—	Text Rounded Reported	15757 · Materials Characterization · Figure 3
Ag3BHT2 and Au3BHT2 no S-H FTIR absorption	no absorption at 2500 cm-1	—	—	Text Qualitative	15757 · Materials Characterization · Figure 3

X-ray photoelectron spectroscopy (XPS)

X-ray photoelectron spectroscopy

Ag3BHT2 powder-pressed thick film · Pellet

XPS on powder-pressed thick film.

Context: pristine Ag3BHT2 pressed thick film
Measurement source: 15757-15759 · Materials Characterization · Figure 5a-b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Ag3BHT2 thick film unbonded sulfur peak 1	163.9 eV	—	—	Text Exact Reported	15757-15758 · Materials Characterization · Figure 5b
Ag3BHT2 thick film unbonded sulfur peak 2	165.0 eV	—	—	Text Exact Reported	15757-15758 · Materials Characterization · Figure 5b
Ag3BHT2 thick film unreacted thiol S-H peak 1	162.5 eV	—	—	Text Exact Reported	15757-15758 · Materials Characterization · Figure 5b
Ag3BHT2 thick film unreacted thiol S-H peak 2	163.6 eV	—	—	Text Exact Reported	15757-15758 · Materials Characterization · Figure 5b

X-ray photoelectron spectroscopy (XPS)

X-ray photoelectron spectroscopy

Ag3BHT2 thin film · Thin Film

PHI 5000 Versa Probe with microfocused 100 um Al X-ray beam.

Context: pristine Ag3BHT2 thin film
Measurement source: 15757-15758 and 15761 · Materials Characterization · Figure 4a-b

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Ag3BHT2 thin film Ag 3d3/2 binding energy	367.5 eV	—	—	Text Exact Reported	15757 · Materials Characterization · Figure 4a
Ag3BHT2 thin film S 2p1/2 binding energy	163.1 eV	—	—	Text Exact Reported	15757 · Materials Characterization · Figure 4b
Ag3BHT2 thin film S 2p3/2 binding energy	161.9 eV	—	—	Text Exact Reported	15757 · Materials Characterization · Figure 4b

X-ray photoelectron spectroscopy (XPS)

X-ray photoelectron spectroscopy

Au3BHT2 powder-pressed thick film · Pellet

XPS on powder-pressed thick film.

Context: pristine Au3BHT2 pressed thick film
Measurement source: 15757-15759 · Materials Characterization · Figure 5c-d

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Au3BHT2 thick film Au(0) 4f5/2 binding energy	89.4 eV	—	—	Text Exact Reported	15758 · Materials Characterization · Figure 5c
Au3BHT2 thick film Au(0) 4f7/2 binding energy	85.9 eV	—	—	Text Exact Reported	15758 · Materials Characterization · Figure 5c

X-ray photoelectron spectroscopy (XPS)

X-ray photoelectron spectroscopy

Au3BHT2 thin film · Thin Film

PHI 5000 Versa Probe with microfocused 100 um Al X-ray beam.

Context: pristine Au3BHT2 thin film
Measurement source: 15757-15758 and 15761 · Materials Characterization · Figure 4c-d

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
Au3BHT2 thin film Au(I) 4f5/2 binding energy	88.6 eV	—	—	Text Exact Reported	15757 · Materials Characterization · Figure 4c
Au3BHT2 thin film Au(I) 4f7/2 binding energy	84.9 eV	—	—	Text Exact Reported	15757 · Materials Characterization · Figure 4c