Electrical Transport — Highly Conductive 2D Metal-Organic Framework Thin Film Fabricated by Liquid-Liquid Interfacial Reaction Using One-Pot-Synthesized Benzenehexathiol

Measurement evidence

Electrical Transport

Highly Conductive 2D Metal-Organic Framework Thin Film Fabricated by Liquid-Liquid Interfacial Reaction Using One-Pot-Synthesized Benzenehexathiol · Chen I.-F., Lu C.-F., Su W.-F. · Langmuir · 2018 · 15754-15762

4 measurement groups · 9 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

four-point probe sheet resistance using Keithley 2400 and Labview

Ag3BHT2 powder-pressed thick film · Pellet

Pressed 7 mm disk; current from 10 to 20 mA; conductivity calculated using SEM thickness.

Geometry
powder-pressed thick film disk, 7 mm diameter
Context
pristine conductive MOF pressed thick film
Measurement source
15759-15761 · Table 2; Experimental Methods · Table 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Ag3BHT2 thick film conductivity average14.2 +/- 3.0 S cm-1+/- 3.0Table
Exact Reported
15759 · Materials Characterization · Table 2
Ag3BHT2 thick film maximum conductivity19.8 S cm-1Table
Exact Reported
15759 · Materials Characterization · Table 2

four-point probe sheet resistance using Keithley 2400 and Labview

Ag3BHT2 thin film · Thin Film

Current from 10 to 20 mA; conductivity calculated using film thickness from SEM cross-section.

Geometry
thin film on Si/SiO2; four-point probe
Context
pristine conductive MOF thin film
Measurement source
15757-15761 · Materials Characterization; Experimental Methods · Table 2; Figure S1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Ag3BHT2 thin film conductivity average290 +/- 23.2 S cm-1+/- 23.2Table
Exact Reported
15759 · Materials Characterization · Table 2
Ag3BHT2 thin film maximum conductivityMarked as a best value within this paper363 S cm-1Table
Exact Reported
15754 and 15759 · Abstract; Table 2 · Table 2
Ag3BHT2 thin film I-V fitted slopeI = 44.49248 V; R2 = 0.99916R2 = 0.99916Figure Axis
Exact Reported
S2 · Electrical conductivity measurement · Figure S1

four-point probe sheet resistance using Keithley 2400 and Labview

Au3BHT2 powder-pressed thick film · Pellet

Pressed 7 mm disk; current from 10 to 20 mA; conductivity calculated using SEM thickness.

Geometry
powder-pressed thick film disk, 7 mm diameter
Context
pristine MOF pressed thick film
Measurement source
15759-15761 · Table 2; Experimental Methods · Table 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Au3BHT2 thick film conductivity average7.46 +/- 1.12 x 10-5 S cm-1+/- 1.12 x 10-5Table
Exact Reported
15759 · Materials Characterization · Table 2
Au3BHT2 thick film maximum conductivity8.07 x 10-5 S cm-1Table
Exact Reported
15759 · Materials Characterization · Table 2

four-point probe sheet resistance using Keithley 2400 and Labview

Au3BHT2 thin film · Thin Film

Thin film on Si/SiO2; current from 10 to 20 mA; conductivity calculated using SEM thickness.

Geometry
thin film on Si/SiO2; four-point probe
Context
pristine MOF thin film
Measurement source
15759-15761 · Table 2; Experimental Methods · Table 2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
Au3BHT2 thin film conductivity average9.15 +/- 0.21 x 10-5 S cm-1+/- 0.21 x 10-5Table
Exact Reported
15759 · Materials Characterization · Table 2
Au3BHT2 thin film maximum conductivity1.12 x 10-4 S cm-1Table
Exact Reported
15759 · Materials Characterization · Table 2