Diffraction Structure — In-Plane Oriented Two-Dimensional Conjugated Metal-Organic Framework Films for High-Performance Humidity Sensing

3 measurement groups · 14 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

HAB-Cu/SDS intermediate · Powder

Cu-Kalpha radiation, room temperature; HAB-Cu/SDS at cSDS = 0.85 mM and 8.5 mM compared with HAB-Cu.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HAB-Cu PXRD d-spacing	2theta = 9.32 degrees, d = 9.45 A	—	—	Text Exact Reported	1149 · Results · Figure 4c; Figure S10
HAB-Cu/SDS PXRD interlayer distance	2theta = 4.41 degrees, d = 20.08 A	—	—	Text Exact Reported	1149 · Results · Figure 4c; Figure S11
SDS molecular chain length	~18.5 A	—	—	Text Approximate	1149 · Results · Figure 4c-e

free-standing in-plane oriented HIB-Cu film · Thin Film

Beamline XRD1; 12.398 keV, lambda = 1 A, grazing incidence angle 0.13 degrees.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
first in-plane GIWAXS peak Qxy	0.54 A-1	—	—	Text Rounded Reported	1148 · Results · Figure 3a-b
out-of-plane GIWAXS peak Qz	1.95 A-1	—	—	Text Rounded Reported	1148 · Results · Figure 3a,c
HIB-Cu d001 stacking distance	3.22 A	—	—	Text Exact Reported	1148 · Results · Figure 3
HIB-Cu d100 lattice spacing	11.63 A	—	—	Text Exact Reported	1148 · Results · Figure 3
SAED first-order reflection	0.86 nm-1	—	—	Text Rounded Reported	1148 · Results · Figure S5
SAED reflection set	0.862, 1.526, 1.736, 2.645, 4.591 nm-1	—	—	Caption Exact Reported	10 · Supporting Figure S5 · Figure S5

free-standing HITP-Cu film · Thin Film

Structure and morphology of HITP-Cu film on support/TEM grid.

Property	Reported value	Normalised value	Uncertainty	Origin and quality	Source
HITP-Cu d100 spacing from SAED	18.51 A	—	—	Text Exact Reported	1150 · Results · Figure S12b
maximum HITP-Cu domain size	up to ~8000 nm2	—	—	Text Approximate	1150 · Results · Figure S14
HITP-Cu AC-HRTEM hexagonal spacing	18.50 A	—	—	Text Exact Reported	1150 · Results · Figure S12c-d
HITP-Cu nearest SAED reflection	0.54 nm-1	—	—	Text Rounded Reported	1150 · Results · Figure S12b
HITP-Cu film thickness	~8 nm	—	—	Text Approximate	1150 · Results · Figure S13