two-point I-V conductivity measurement
free-standing in-plane oriented HIB-Cu film · Thin Film
Room temperature under nitrogen; voltage swept from -0.5 V to 0.5 V in 400 steps.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| HIB-Cu film conductivity, 120 nm filmMarked as a best value within this paper | sigma_120nm = 0.103 S/m | 0.00103 S/cm | — | Figure Axis Rounded Reported | 20 · Supporting Figure S15 · Figure S15 |
| HIB-Cu film conductivity, 54 nm filmMarked as a best value within this paper | sigma_54nm = 0.117 S/m | 0.00117 S/cm | — | Figure Axis Rounded Reported | 20 · Supporting Figure S15 · Figure S15 |
| HIB-Cu intrinsic electrical conductivity approximate | ~0.1 S/m | 0.001 S/cm | — | Text Approximate | 1150 · Results · Figure S15 |