Electrical Transport — In-Plane Oriented Two-Dimensional Conjugated Metal-Organic Framework Films for High-Performance Humidity Sensing

Measurement evidence

Electrical Transport

In-Plane Oriented Two-Dimensional Conjugated Metal-Organic Framework Films for High-Performance Humidity Sensing · Park S., Zhang Z., Qi H. et al. · ACS Materials Letters · 2022 · 1146-1153

2 measurement groups · 6 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

two-point I-V conductivity measurement

free-standing in-plane oriented HIB-Cu film · Thin Film

Room temperature under nitrogen; voltage swept from -0.5 V to 0.5 V in 400 steps.

Temperature
room temperature
Atmosphere
nitrogen
Geometry
HIB-Cu films on n-doped Si/300 nm SiO2; 70 nm Au contacts; channel length 100 um; width 4.5 mm
Context
pristine HIB-Cu film
Measurement source
20 · Supporting Figure S15 · Figure S15
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
HIB-Cu film conductivity, 120 nm filmMarked as a best value within this papersigma_120nm = 0.103 S/m0.00103 S/cmFigure Axis
Rounded Reported
20 · Supporting Figure S15 · Figure S15
HIB-Cu film conductivity, 54 nm filmMarked as a best value within this papersigma_54nm = 0.117 S/m0.00117 S/cmFigure Axis
Rounded Reported
20 · Supporting Figure S15 · Figure S15
HIB-Cu intrinsic electrical conductivity approximate~0.1 S/m0.001 S/cmText
Approximate
1150 · Results · Figure S15

Hall effect measurement, van der Pauw geometry

free-standing in-plane oriented HIB-Cu film · Thin Film

Lakeshore Hall System 9700A; magnetic field swept from -4 T to 4 T at 300 K.

Temperature
300
Geometry
van der Pauw pattern
Context
pristine HIB-Cu film
Measurement source
25 · Supporting Figure S18 · Figure S18
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
HIB-Cu Hall carrier densityMarked as a best value within this papern = 4.82E13 cm-348200000000000000000 m-3Figure Axis
Rounded Reported
25 · Supporting Figure S18 · Figure S18
HIB-Cu Hall mobilityMarked as a best value within this papermu = 3.2 +/- 0.4 cm2 V-1 s-10.00032 m2/V/s+/- 0.4 cm2/V/sFigure Axis
Rounded Reported
25 · Supporting Figure S18 · Figure S18
HIB-Cu majority-carrier typep-type semiconducting behaviourCaption
Qualitative
25 · Supporting Figure S18 · Figure S18