Microscopy Morphology — In-Plane Oriented Two-Dimensional Conjugated Metal-Organic Framework Films for High-Performance Humidity Sensing

Measurement evidence

Microscopy Morphology

In-Plane Oriented Two-Dimensional Conjugated Metal-Organic Framework Films for High-Performance Humidity Sensing · Park S., Zhang Z., Qi H. et al. · ACS Materials Letters · 2022 · 1146-1153

4 measurement groups · 12 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM-EDX elemental mapping and spectrum

free-standing in-plane oriented HIB-Cu film · Thin Film

FESEM, Carl Zeiss Gemini, 1-3 kV.

Context
pristine HIB-Cu film
Measurement source
1148 · Results · Figure S2
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
EDX C atomic ratio in HIB-Cu filmC:N:Cu = 46:43:11Text
Rounded Reported
1148 · Results · Figure S2
EDX Cu atomic ratio in HIB-Cu filmC:N:Cu = 46:43:11Text
Rounded Reported
1148 · Results · Figure S2
EDX N atomic ratio in HIB-Cu filmC:N:Cu = 46:43:11Text
Rounded Reported
1148 · Results · Figure S2

300 kV AC-HRTEM, FFT and Fourier filtering

free-standing in-plane oriented HIB-Cu film · Thin Film

FEI Titan 80-300 microscope, 300 kV.

Geometry
film on TEM grid
Context
pristine HIB-Cu film with SDS-mediated synthesis
Measurement source
1148-1149 · Results · Figure 3d-g; Figure S6
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
average HIB-Cu crystallite domain size with SDS1691.3 +/- 802.3 nm2+/- 802.3 nm2Text
Exact Reported
1149 · Results · Figure S6
maximum HIB-Cu crystal domain size with SDSup to ~3000 nm2Text
Approximate
1151 · Summary · Figure S6
HIB-Cu pore size~1 nmText
Approximate
1149 · Results · Figure 3g

cross-section SEM and AFM/thickness analysis

free-standing in-plane oriented HIB-Cu film · Thin Film

Thickness of HIB-Cu film varied with HAB concentration.

Context
pristine HIB-Cu film
Measurement source
1148 · Results · Figure 2c
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
HIB-Cu thickness at 1.25 mM HAB54 +/- 14 nm+/- 14 nmFigure Axis
Rounded Reported
1148 · Results · Figure 2c
HIB-Cu thickness at 2.5 mM HAB119 +/- 8 nm+/- 8 nmFigure Axis
Rounded Reported
1148 · Results · Figure 2c
HIB-Cu thickness at 3.75 mM HAB343 +/- 16 nm+/- 16 nmFigure Axis
Rounded Reported
1148 · Results · Figure 2c
tunable HIB-Cu film thickness range50-340 nmText
Range
1148 · Results · Figure 2c

TEM image analysis / ImageJ domain and amorphous-fraction analysis

HIB-Cu film made without SDS · Thin Film

Contrast experiment without SDS.

Context
pristine HIB-Cu control without SDS
Measurement source
11-12 · Supporting Figures · Figures S6-S7
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
amorphous areal fraction without SDS35.83%0.3583 fractionCaption
Exact Reported
12 · Supporting Figure S7 · Figure S7
average HIB-Cu crystallite size without SDS204.3 +/- 96.8 nm2+/- 96.8 nm2Text
Exact Reported
1149 · Results · Figure S6