Measurement evidence
Oriented Thin Films of Electroactive Triphenylene Catecholate-Based Two-Dimensional MetalOrganic Frameworks · Mahringer A., Jakowetz A.C., Rotter J.M. et al. · ACS Nano · 2019 · 6711-6719
Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.
Cu-CAT-1 on ITO agglomerate control · Thin Film
Control experiment for Cu-CAT-1 growth on ITO.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| orientation/morphology outcome | non-oriented crystalline agglomerates | — | — | Caption Qualitative | S30 · Control experiments · Figure S4.24 |
Oriented Co-CAT-1 thin film on glass · Thin Film
Glass-supported Co-CAT-1 film orientation and morphology.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| preferred orientation | preferentially oriented film | — | — | Caption Qualitative | S26 · SEM and GIWAXS analysis · Figure S4.17 |
Oriented Co-CAT-1 thin film on gold · Thin Film
2D GIWAXS indexed to M-CAT-1; SEM cross-sections/top-view, TEM after removing film, AFM surface roughness.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| TEM crystalline domain size | about/up to 30 nm | — | — | Caption Approximate | S15-S17 · Additional TEM analysis · Figures S4.1-S4.3 |
| film orientation | c-axis normal to substrate surface | — | — | Text Qualitative | p004 · GIWAXS analysis · Figure 2 |
| AFM RMS roughness Sq | 19 nm | — | — | Caption Exact Reported | S22-S23 · Additional AFM analysis · Figures S4.10-S4.12 |
| AFM Rq roughness | 9 nm | — | — | Caption Exact Reported | S22-S23 · Additional AFM analysis · Figures S4.10-S4.12 |
| film thickness | 180 nm | — | — | Visual Estimate Approximate | p003 · SEM cross-section · Figure 2g-i |
Co-CAT-1 film on ITO · Thin Film
Oxide-supported film orientation and morphology.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| preferred orientation | crystal c-axes preferentially vertically oriented | — | — | Text Qualitative | p005 · GIWAXS on ITO · Figures S4.15 and S4.18 |
| film thickness | about 1000 nm | — | — | Text Approximate | p005 · Conductive metal-oxide surfaces · Figures S4.15 and S4.18 |
Oriented Cu-CAT-1 film on gold from copper trifluoroacetylacetonate · Thin Film
2D GIWAXS indexed to M-CAT-1; SEM cross-sections/top-view, TEM after removing film, AFM surface roughness.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| TEM crystalline domain size | about/up to 45 nm | — | — | Caption Approximate | S15-S17 · Additional TEM analysis · Figures S4.1-S4.3 |
| film orientation | c-axis normal to substrate surface | — | — | Text Qualitative | p004 · GIWAXS analysis · Figure 2 |
| AFM RMS roughness Sq | 91 nm | — | — | Caption Exact Reported | S22-S23 · Additional AFM analysis · Figures S4.10-S4.12 |
| AFM Rq roughness | 51 nm | — | — | Caption Exact Reported | S22-S23 · Additional AFM analysis · Figures S4.10-S4.12 |
| film thickness | 2200 nm | — | — | Visual Estimate Approximate | p003 · SEM cross-section · Figure 2g-i |
Oriented Ni-CAT-1 thin film on glass · Thin Film
Glass-supported Ni-CAT-1 film orientation and morphology.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| needle-like crystal length | about 200 nm | — | — | Caption Approximate | S26 · SEM and GIWAXS analysis · Figure S4.16 |
Oriented Ni-CAT-1 thin film on gold · Thin Film
2D GIWAXS indexed to M-CAT-1; SEM cross-sections/top-view, TEM after removing film, AFM surface roughness.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| interlayer distance from (004) | 3.3 Angstrom | — | — | Text Exact Reported | p004 · GIWAXS analysis · Figure 2 |
| GIWAXS qy (100) reflection | qy = 3.9 nm^-1 | — | — | Text Exact Reported | p004 · GIWAXS analysis · Figure 2 |
| GIWAXS qy (200) reflection | qy = 7.1 nm^-1 | — | — | Text Exact Reported | p004 · GIWAXS analysis · Figure 2 |
| GIWAXS qy (210) reflection | qy = 9.2 nm^-1 | — | — | Text Exact Reported | p004 · GIWAXS analysis · Figure 2 |
| TEM crystalline domain size | about/up to 50 nm | — | — | Caption Approximate | S15-S17 · Additional TEM analysis · Figures S4.1-S4.3 |
| film orientation | c-axis normal to substrate surface | — | — | Text Qualitative | p004 · GIWAXS analysis · Figure 2 |
| AFM RMS roughness Sq | 8 nm | — | — | Caption Exact Reported | S22-S23 · Additional AFM analysis · Figures S4.10-S4.12 |
| AFM Rq roughness | 7 nm | — | — | Caption Exact Reported | S22-S23 · Additional AFM analysis · Figures S4.10-S4.12 |
| film thickness | 200 nm | — | — | Visual Estimate Approximate | p003 · SEM cross-section · Figure 2g-i |
Oriented Ni-CAT-1 thin film on ITO · Thin Film
Oxide-supported film orientation and morphology.
| Property | Reported value | Normalised value | Uncertainty | Origin and quality | Source |
|---|---|---|---|---|---|
| preferred orientation | crystal c-axes preferentially vertically oriented | — | — | Text Qualitative | p005 · GIWAXS on ITO · Figures S4.15 and S4.18 |
| AFM RMS roughness Sq | 25 nm | — | — | Caption Exact Reported | S28 · Additional AFM analysis · Figure S4.21 |
| AFM Rq roughness | 18 nm | — | — | Caption Exact Reported | S28 · Additional AFM analysis · Figure S4.21 |
| film thickness | about 300 nm | — | — | Text Approximate | p005 · Conductive metal-oxide surfaces · Figures S4.15 and S4.18 |