Microscopy Morphology — Oriented Thin Films of Electroactive Triphenylene Catecholate-Based Two-Dimensional MetalOrganic Frameworks

Measurement evidence

Microscopy Morphology

Oriented Thin Films of Electroactive Triphenylene Catecholate-Based Two-Dimensional MetalOrganic Frameworks · Mahringer A., Jakowetz A.C., Rotter J.M. et al. · ACS Nano · 2019 · 6711-6719

4 measurement groups · 7 results

Reported values remain attached to the sample, method, conditions, extraction quality and source location that produced them.

SEM

Co-CAT-1 bulk microcrystalline powder · Powder

Bulk M-CAT-1 crystallite morphology from SEM micrographs.

Context
pristine_control
Measurement source
S11 · XRD, SEM and TEM analysis · Figure S3.1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
needle-like crystallite length3-4 umCaption
Range
S11 · XRD, SEM and TEM analysis · Figure S3.1

SEM

Cu-CAT-1 bulk microcrystalline powder · Powder

Bulk M-CAT-1 crystallite morphology from SEM micrographs.

Context
pristine_control
Measurement source
S11 · XRD, SEM and TEM analysis · Figure S3.1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
needle-like crystallite lengthup to 10 umCaption
Approximate
S11 · XRD, SEM and TEM analysis · Figure S3.1

SEM

Ni-CAT-1 bulk microcrystalline powder · Powder

Bulk M-CAT-1 crystallite morphology from SEM micrographs.

Context
pristine_control
Measurement source
S11 · XRD, SEM and TEM analysis · Figure S3.1
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
needle-like crystallite length1-2 umCaption
Range
S11 · XRD, SEM and TEM analysis · Figure S3.1

XRD detector scan, SEM, AFM

Oriented Cu-CAT-1 thin film on gold from copper nitrate trihydrate · Thin Film

Cu-CAT-1 film from copper nitrate trihydrate precursor on gold.

Geometry
Au-supported thin film
Context
pristine
Measurement source
S24-S25 · Cu-CAT-1 film obtained from cupper nitrate trihydrate · Figure S4.13; Figure 4.14
PropertyReported valueNormalised valueUncertaintyOrigin and qualitySource
AFM RMS roughness Sq20 nmCaption
Exact Reported
S25 · AFM · Figure 4.14
rod lengthabout 220 nmText
Approximate
p004 · Cu screening · Figure S4.13
rod widthabout 40 nmText
Approximate
p004 · Cu screening · Figure S4.13
AFM Rq roughness10 nmCaption
Exact Reported
S25 · AFM · Figure 4.14